Thin films of PbTiO3 were prepared by sol-gel method on platinum-coated-Si and Al2O3 and annealed at 600°C. The annealing time of the films, deposited on Si, were 6 and 12 hours, respectively. Micro-Raman spectra show high background in the low frequency region and the bands are broader with respect to the single crystal work, which indicates the polycrystalline nature of the samples. The film annealed for 12 hours showed more pronounced peaks in the spectra when compared to the film annealed for 6 hours. Micro-Raman measurements on different spots in the film indicate that the PT film on platinum-coated silicon substrate is highly inhomogeneous. In the case of PT/Al2O3 such studies show a homogeneous film. The frequencies of most of the modes are decreased, which is associated to grains under stress. The nature of the stress is discussed. Although film stress may not be homogeneous, a stress value around 1.2 GPa is estimated from Raman data. XRD and SEM techniques were used for structural characterization.