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Optical Characterization of Polydiacetylene Langmuir Blodgett Film on Silicon Substrates

Published online by Cambridge University Press:  25 February 2011

P. Miller ,
A. K. M. Rahman ,
S. V. Broude  and
S. Tripathy
P. Miller
Affiliation:
University of Lowell, Department of Physics, Lowell, MA, 01854.
A. K. M. Rahman
Affiliation:
University of Lowell, Department of Physics, Lowell, MA, 01854.
S. V. Broude
Affiliation:
University of Lowell, Department of Physics, Lowell, MA, 01854.
S. Tripathy
Affiliation:
University of Lowell, Department Chemistry, Lowell, MA, 01854.
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Abstract

A bilayer of a surfactive polydiacetylene (15–8 PDA) has been deposited by Langmuir-Blodgett technique on a smooth Silicon substrate using a commercial Lauda film balance [1] . The morphology of the deposited film has been studied by cross-polarized optical microscopy, and laser light scattering microscopy. Usual crystalline domains with size ranging from 5 to 50 μm can be seen between cross polarizers. Nonuniformities and voids in the film are observed by imaging the scattered light from a visible laser beam incident at grazing angle onto the film.

Raman scattering study on these bilayers have been carried out to investigate their vibronic structure. Information about vibronic levels from PDA has been used to define the extent of disorder and crystalline phase of the bilayer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 173: Symposium Q – Advanced Organic Solid State Materials , 1989 , 643
Copyright
Copyright © Materials Research Society 1990

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References

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