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Nucleation and Growth kinetics of Cu2O During Reduction of CuO Thin Films

Published online by Cambridge University Press:  15 February 2011

Jian Li
Affiliation:
Dept. of Materials Science and Engineering, Cornell University, Ithaca, NY 14853
K. N. Tu
Affiliation:
IBM, T.J. Watson Research Center, Yorktown Heights, NY 10598
J. W. Mayer
Affiliation:
Dept. of Materials Science and Engineering, Cornell University, Ithaca, NY 14853
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Abstract

The combination of 16O(α, α)16O oxygen resonance measurement and transmission electron microscopy (TEM) provides an unique and effective method to study the kinetics of nucleation and growth of Cu2O phase during reduction. In situ TEM observation showed that isolated and large Cu2O grains emerge from the small CuO grain matrix and the growth of Cu2O grains is linear with time. We propose that the discontinuous morphology of grain growth of Cu2O is due to the migration of the Cu2O-CuO phase boundary induced by oxygen out-diffusion along the moving phase boundary. Based on the classical analysis of phase transformation by Johnson, Mehl and Avrami, the activation enthalpy of nucleation of Cu2O phase in the CuO matrix has been deduced as ΔEn=2.3 eV. The specific interfacial energy between CuO and Cu2O phases has been estimated as 0.5 eV/atom.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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