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Nonlinear characteristics of super resolution chalcogenide thin film

Published online by Cambridge University Press:  01 February 2011

Se-Young Kim ,
Myung-jin Kang  and
Se-Young Choi
Se-Young Kim
Affiliation:
Department of Ceramic Engineering, Yonsei University 134, Shinchon-Dong, Sudaemun-Ku, Seoul, 120–749, Korea
Myung-jin Kang
Affiliation:
Department of Ceramic Engineering, Yonsei University 134, Shinchon-Dong, Sudaemun-Ku, Seoul, 120–749, Korea
Se-Young Choi
Affiliation:
Department of Ceramic Engineering, Yonsei University 134, Shinchon-Dong, Sudaemun-Ku, Seoul, 120–749, Korea
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Abstract

A third order nonlinear optical material, As2Se3 was proposed for super resolution near field structure disk. As2Se3 was deposited by thermal evaporation technique. Composition, phase, surface morphology, linear/non-linear optical properties were obtained from EPMA, XRD, AFM, UV-VIS-NIR spectrophotometer and VASE. As2Se3 thin film showed large non-linear optical characteristics (XR(3) =7.42×10-7 m2/w, γ=1.268×10-5m2/w) and self-focusing phenomenon. Super resolution effects of the As2Se3 thin films were measured by using the laser beam profiler. As a result, recording density can be enhanced by 2.3 times, in case of 350nm As2Se3 thin film was deposited as super-RENS.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 803: Symposia GG/HH – Advanced Characterization Techniques for Data Storage Materials – Phase Change and Nonmagnetic Materials for Data Storage , 2003 , HH6.6
Copyright
Copyright © Materials Research Society 2004

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References

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