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Nitrogen Gas-Cluster Ion Beam – A New Nitrogen Source for GaN Growth

Published online by Cambridge University Press:  11 February 2011

Y. Shao
Affiliation:
Epion Corporation of JDS Uniphase, 37 Manning Rd., Billerica, MA 01821
T. C. Chen
Affiliation:
Boston Univ. Dept. Electrical & Computer Eng., 8 Saint Mary's St., Boston, MA 02215
D. B. Fenner
Affiliation:
Epion Corporation of JDS Uniphase, 37 Manning Rd., Billerica, MA 01821
T. D. Moustakas
Affiliation:
Boston Univ. Dept. Electrical & Computer Eng., 8 Saint Mary's St., Boston, MA 02215
George Chu
Affiliation:
Agere System corp., Bell Lab, Murray Hill, NJ 07974
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Abstract

In this paper we report sapphire nitridation and GaN film growth by using ionized nitrogen clusters as a nitrogen source. The clusters, typically 2000–3000 molecules/charge, are generated by a prototype GCIB source. The clusters are accelerated to 10–25 kV and disintegrate upon impact with the substrate surface where they react with Ga atoms to form GaN. The efficiency of this novel nitrogen source was tested by studying the nitridation of (0001) sapphire substrates at relatively low temperatures of 200 - 400°C. The effect of exposure of the substrate to the nitrogen cluster-ion beam was examined by XPS, RHEED and AFM. It was found that the amount of retained surface nitrogen increases nonlinearly with increasing beam energy. There exists a threshold energy, ∼ 20 kV, above which nitrogen retention is significantly enhanced.

GaN films were grown with such nitrogen clusters heteroepitaxially on sapphire/AlN-buffer (MBE grown) and homoepitaxially on thick GaN on sapphire (HVPE grown).TEM cross-section images indicate that the heteroepitaxial GaN films had defect density similar to that of MBE and MOCVD grown films. The homoepitaxially-grown GaN films were found to replicate the GaN templates and show strong cathodoluminescence (CL) emission at 363 nm with FWHM of 9 nm. Furthermore, the spectra show no evidence of yellow band emission.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

REFERENCES

1. Nakamura, S. and Fasol, G., The Blue Laser Diode (Springer, Berlin, 1997).Google Scholar
2. Bulman, G.E., Doverspike, K., Sheppard, S.T., Weeks, T.W., Kong, H.S., Dieringer, H.M., Edmond, J.A., Brown, J.D., Swindell, J.T., and Schetzena, J.F., Electron. Lett. 33, 1556 (1997).Google Scholar
3. Shao, Y., Chen, T.C., Fenner, D.B. and Moustakas, T.D., “Growth of GaN by Ion Beam Cluster Deposition”, Nitride Semiconductor Workshop, Richmond, March 2002, (unpublished).Google Scholar
4. Chu, W.K., Li, Y.P., Liu, J.R., Wu, J.Z., Tidrow, S.C., Toyoda, N., Matsuo, J. and Yamada, I., Appl. Phys. Lett. 72, 246 (1998).Google Scholar
5. Fenner, D.B., Torti, R.P., Allen, L.P., Toyota, N., Kirkpatrick, A.R., Greer, J.A., DiFilippo, V., and Hautala, J., MRS Symp. Proceedings, Vol. 585, (2000).Google Scholar
6. Toyoda, N., Hagiwara, N., Matsuo, J., and Yamada, I., Nucl. Inst. And Methods in Phys. Res. B 161–163, 980, (2000).Google Scholar
7. Allen, L.P., Fenner, D.B., Toyota, N., Skinner, W.J., Chandonnet, R., Deziel, S.E., Torti, R.P., Proc. of the 1999 IEEE Int. Silicon-on-Insulator Conference, 117, (1999).Google Scholar
8. Katsumata, H., Matsuo, J., Nishihara, T., Tachibana, T., Yamada, K., Adachi, M., Minami, E. and Yamada, I., Applications of Accelerators in Research and Industry, edited by Duggan, J.L. and Morgan, I.L., AIP Press. 409, (1999).Google Scholar
9. Minami, E., Mtsuo, J. and Yamada, I., Application of Accelerators in Research and Industry, edited by Duggan, J.D. and Morgan, I. L., AIP Press. 435, (1999).Google Scholar
10. Saito, H., Kato, T., Yoneta, M., Ohishi, M., Matsuo, J. and Yamada, I., Phys. Stat. Sol. (a), 180, 251 (2000).Google Scholar
11. Ormerod, R.M., Peat, K.L., Wytenburg, W.J. and Lambert, R.M., Surf. Sci., 269–270, 506 (1992).Google Scholar