Skip to main content Accessibility help
×
Home

New Method for a Lensless Electron Microscope: Achieving High Resolution and Overcoming Effects of Multiple Scattering

  • S. Y. Tong (a1), H. Huang (a1) and Hua Li (a1)

Abstract

We present the processes necessary for the development of a lensless electron microscope with a resolution of ≤ 0.6Å and an image position accuracy of ≤ 0.3Å. The technique inverts interference fringes of emitted electrons from localized sources embedded in a material. Unlike conventional methods which use the Helmholtz-Kirchhoff integral theorem, the new process starts with 3-dimensional Fourier transformation with phaseshift correction, SWEEP for forward-scattering electrons and REEP for back-scattering electrons. These processes are applicable to strong multiple scattering systems as well as systems whose source atoms are buried below the surface. Materials with long-range or local order can be studied; coupled to a small spot-sized incident beam, images of disordered materials can be formed.

Copyright

References

Hide All
1) Barton, J.J., Phys. Rev. Lett. 61, 1345 (1988).
2) Saldin, D.K. and de Andres, P.L., Phys. Rev. Lett. 64, 1270 (1990).
3) Harp, G.R., Saldin, D.K. and Tonner, B.P., Phys. Rev. Lett. 65, 1012 (1990).
4) Wei, C.M., Zhao, T.C. and Tong, S.Y., Phys. Rev. Lett. 65, 2278 (1990).
5) Harp, G.R., Saldin, D.K., and Tonner, B.P., Phys. Rev. B 42, 9199 (1990).
6) Wei, C.M., Zhao, T.C., Tong, S.Y., Phys. Rev. B 43, March 15 (1991).
7) Tong, S.Y., Wei, C.M., Zhao, T.C., Huang, H., and Li, Hua, Phys. Rev. Lett. 66, 60 (1991).
8) Tong, S.Y., Li, Hua and Huang, H., Phys. Rev. Lett., to appear.
9) Tong, S.Y., Li, C.H. and Lubinsky, A.R., Phys. Rev. Lett. 39, 498 (1977).
10) Li, C.H., Lubinsky, A.R. and Tong, S.Y., Phys. Rev. B 17, 3128 (1978).
11) Li, H. and Tonner, B.P., Phys. Rev. B 37, 3959 (1988).
12) Wang, X.D., Han, Z.L., Tonner, B.P., Chen, Y. and Tong, S.Y., Science 248, 1129 (1990).
13) Bedrossian, P., Meade, R.D., Mortensen, K., Chen, D.M., Golovchenko, J.A., Vanderbilt, D., Phys. Rev. Lett. 63, 1257 (1989).
14) Lyo, I.-W., Kaxiras, E., and Avouris, Ph., Phys. Rev. Lett. 53, 1261 (1989).
15) Headrich, L., Robinson, I.K., Vlieg, E., Feldman, L.G., Phys. Rev. Lett. 63, 1253 (1989).
16) Kaxiras, E., Pandey, K.C., Himpsel, F.J., Tromp, R.M., Phys. Rev. B41, 1262 (1990).
17) Huang, H., Tong, S.Y., Quinn, J., and Jona, F., Phys. Rev. B41, 3276 (1990).
18) Egelhoff, W.F. Jr., Phys. Rev. B 30, 1051 (1984).
19) Poon, H.C. and Tong, S.Y., Phys. Rev. B 30, 6211 (1984).
20) Tong, S.Y., Poon, H.C. and Snider, D.R., Phys. Rev. B 32, 2096 (1985).
21) Xu, M.L. and Van Hove, M.A., Surface Sci. 207, 215 (1989).
22) Chambers, S.A., Anderson, S.B., Weaver, J.H., Phys. Rev. B 32, 4872 (1985).
23) Egelhoff, W.F. Jr. in Critical Reviews in Solid State and Materials Sciences, 16, 213 (1990).
24) Fadley, C.S., Synchrotron Radiation Research: Advances in Surface Science, R.Z., Bachrach, ed., Plenum Press, NY (1990).
25) Tong, S.Y., Puga, M.W., Poon, H.C. and Xu, M.L. in Chemistry and Physics of Solid Surfaces VI, eds. Vanselow, R. and Howe, R., Springer, NY (1986).
26) Chambers, S.A., Wagner, T.J. and Weaver, J.H., Phys. Rev. B 36, 8992 (1987).
27) Li, Hong and Tonner, B.P., Phys. Rev. B 40, 10241 (1989).
28) Poon, H.C., Snider, D.R. and Tong, S.Y., Phys. Rev. B 33, 2198 (1986).
29) Huang, H., Li, Hua and Tong, S.Y., to be published.
30) Huang, H., Li, Hua and Tong, S.Y., to be published.
31) Barton, J.J. and Terminello, L.J., in The Structure of Surfaces-III, eds. S.Y., Tong, M.A., Van Hove, X., Xide and K., Takayanagi, Springer, Berlin (1991).

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed