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Narrow-Band Synchrotron Radiation Excitation of Soft X-Ray Emission Spectra

Published online by Cambridge University Press:  15 February 2011

K. E. Miyano ,
W. L. O'Brien ,
D. L. Ederer ,
T. A. Callcott ,
J. J. Jia ,
Q.-Y. Dong ,
L. Zhou ,
J. C. Woicik  and
D D. R. Mueller
K. E. Miyano
Affiliation:
Tulane University, New Orleans, LA 70118
W. L. O'Brien
Affiliation:
University of Tennessee, Knoxville, TN 37996
D. L. Ederer
Affiliation:
Tulane University, New Orleans, LA 70118
T. A. Callcott
Affiliation:
University of Tennessee, Knoxville, TN 37996
J. J. Jia
Affiliation:
University of Tennessee, Knoxville, TN 37996
Q.-Y. Dong
Affiliation:
University of Tennessee, Knoxville, TN 37996
L. Zhou
Affiliation:
University of Tennessee, Knoxville, TN 37996
J. C. Woicik
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
D D. R. Mueller
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
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Abstract

Monochromatized synchrotron radiation has been employed as the excitation source for soft x-ray emission spectroscopy. In the present paper changes in the emission spectra that occur as the excitation energy is varied near the core-absorption threshold are discussed. In the case of crystalline silicon, strong variations are seen in the L2,3 emission for excitation energies up to 30 eV above threshold. These variations are shown to be dependent on the crystalline order of the material and can be interpreted in terms of restrictions on the crystal momentum that arise in an inelastic scattering description of the combined absorption and emission. On the other hand this description is less relevant to the excitation-energy dependence of ionic insulators, in which strong phonon coupling removes these restrictions on crystal momentum. In the insulators B2O3 and BN strong variations in the emission are observed at threshold, upon creation of a core exciton: the exciton affects the emission through its influence on the phonon coupling as well as on the initial and final-state screening.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 307: Symposium L – Applications of Synchrotron Radiation Techniques to Materials Science , 1993 , 199
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Fabian, D. J. and Watson, L. M. (eds.), Band Structure and Spectroscopy of Metals and Alloys (Academic Press, New York, 1973).Google Scholar
2. Krause, M. O., J. Phys. Chem. Ref. Data 8, 307 (1979).Google Scholar
3. O'Brien, W. L., Jia, J., Dong, Q.-Y., Callcott, T. A., Miyano, K. E., Ederer, D. L., Mueller, D. R., and Kao, C.-C., Phys. Rev. Lett. 70, 238 (1993).CrossRefGoogle Scholar
4. Callcott, T. A., O'Brien, W. L., Jia, J. J., Dong, Q. Y., Ederer, D. L., Watts, R. N., and Mueller, D. R., Nucl. Instrum. Methods Phys. Res. A 319, 128 (1992).CrossRefGoogle Scholar
5. Callcott, T. A., Tsang, K. L., Zhang, C. H., Ederer, D. L., and Arakawa, E. T., Rev. Sci. Instrum. 57, 2680 (1986).Google Scholar
6. Klfma, J., J. Phys. C 3, 70 (1970).Google Scholar
7. Rubensson, J.-E., Mueller, D., Shuker, R., Ederer, D. L., Zhang, C. H., Jia, J., and Callcott, T. A., Phys. Rev. Lett. 64, 1047 (1990).Google Scholar
8. Wassdahl, N., Bleckert, P., Bray, G., Glans, P., Mårtensson, N., Nordgren, J., Rubensson, J.-E., Nyholm, R., and Cramm, S., in X-ray and Inner Shell Processes, edited by Carlson, T. A., Krause, M. O., and Manson, S. T. (American Institute of Physics, New York, 1990), p. 451, and references therein.Google Scholar
9. Cowan, P. L., Phys. Scr. T 31, 112 (1990), and references therein.Google Scholar
10. Ma, Y., Wassdahl, N., Skytt, P., Guo, J., Nordgren, J., Johnson, P. D., Rubensson, J.-E., Boske, T., Eberhardt, W., and Kevan, S. D., Phys. Rev. Lett. 69, 2598 (1992).Google Scholar
11. Callcott, T. A., Arakawa, E. T., and Ederer, D. L., Phys. Rev. B 16, 5185 (1977).Google Scholar
12. Almbladh, C.-O., Phys. Rev. B 16, 4343 (1977).CrossRefGoogle Scholar
13. O'Brien, W. L., Jia, J., Dong, Q.-Y., Callcott, T. A., Miyano, K. E., Ederer, D. L., Mueller, D. R., and Kao, C.-C., Phys. Rev. B 47, 140 (1993).CrossRefGoogle Scholar
14. Carson, R. D. and Schnatterly, S. E., Phys. Rev. B 39, 1659 (1989).Google Scholar
15. Miyano, K. E., Ederer, D. L., Callcott, T. A., O'Brien, W. L., Jia, J. J., Zhou, L., Dong, Q.-Y., Ma, Y., Woicik, J. C., and Mueller, D. R., to be published.Google Scholar