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Nanoscale Control of Layer Thickness for EL Devices by Mass-controlled Layer-by-layer Sequential Adsorption Process

Published online by Cambridge University Press:  21 March 2011

Seimei Shiratori ,
Masayoshi Yamada ,
Takahiro Ito ,
Tom.C. Wang  and
Michael F. Rubner
Seimei Shiratori
Affiliation:
Dept.of Applied Physics & Physico-informatics, KEIO UniversityHiyoshi Kouhoku-ku Yokohama 223-8522, JAPAN
Masayoshi Yamada
Affiliation:
Dept.of Applied Physics & Physico-informatics, KEIO UniversityHiyoshi Kouhoku-ku Yokohama 223-8522, JAPAN
Takahiro Ito
Affiliation:
Dept.of Applied Physics & Physico-informatics, KEIO UniversityHiyoshi Kouhoku-ku Yokohama 223-8522, JAPAN
Tom.C. Wang
Affiliation:
Massachusetts Institute of Technology, Cambridge MA 02139, USA
Michael F. Rubner
Affiliation:
Massachusetts Institute of Technology, Cambridge MA 02139, USA
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Abstract

A mass controlled layer-by-layer sequenitial adsorption process for polyelectlrolytes was newly developed for the fabrication of functional devices using ultra-thin organic film formed by various polymers of different polarity of charge. In this study hydrophobic Ruthenium complex monomer • tris(bipyridyl) ruthenium(II) hexafluorophosphate • was micelle-wrapped with an anionic surfactant, sodium dodecylbenzenesulfonate, and was assembled with PAH (poly (allylamine hydrochloride)), which has the opposite charge, on ITO substrates. With this method, we succeeded in fabricating ultra-thin organic films even when the adsorption material is not polymer but monomer. Moreover it was found that the film thickness of the self-assembled Ru micelle/PAH had a linear relationship with the number of bilayers. By using this process, an EL device was fabricated by depositing the thin film of micelle-wrapping ruthenium complex monomer on ITO and metal electrode on top of the film. Light emission was observed by applying voltage to this device.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 598: Symposium BB – Electrical, Optical, & Magenetic Properties...V , 1999 , BB1.9
Copyright
Copyright © Materials Research Society 1999

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References

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