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Nanocharacterization of Relaxation Properties in Organic Thin Film Electronic Materials

Published online by Cambridge University Press:  26 February 2011

Tomoko Gray
Affiliation:
torara@u.washington.edu, United States
Rene Overney
Affiliation:
roverney@u.washington.edu, University of Washington, Benson Hall, Box 351750, Seattle, WA, 98195, United States
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Abstract

With increased molecular complexity of organic thin film electronics, novel characterization methods are required to provide nanoscale material property information. Particularly important in polymer thin film electronics are methods characterizing the mobility properties of materials that are in amorphous unsteady states. If the unsteady nature of materials is paired with dimensional and interfacial constraints in anisotropic systems, such as thin films, it produces material systems of great challenges with enormous engineering potentials. Two examples are addressed in this paper, involving desired and undesired supramolecular alignments in polymer thin films, the spectral stability in organic blue-light emitting diodes and the electro-optical (EO) activity in organic non-linear optical (NLO) materials, in conjunction with novel scanning probe microscopy (SFM) based characterization tools. The nanoscopic methods discussed here, i.e., shear modulation force microscopy (SM-FM), and nanoscale isothermal friction analysis (NIFA), offer a quantitative approach for investigating the mobility/stability of organic semiconductor polymer films. Thereby, local properties such as energy barriers for sub-molecular motions (relaxations) and critical transition temperatures can be directly inferred from organic films that are used in actual electronic devices.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

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