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Multiplicative Noise in Microstructure Evolution

Published online by Cambridge University Press:  01 February 2011

K. G. Wang ,
M. E. Glicksman  and
P. Crawford
K. G. Wang
Affiliation:
Materials Science and Engineering Department, Rensselaer Polytechnic Institute, Troy, NY 12180
M. E. Glicksman
Affiliation:
Materials Science and Engineering Department, Rensselaer Polytechnic Institute, Troy, NY 12180
P. Crawford
Affiliation:
Materials Science and Engineering Department, Rensselaer Polytechnic Institute, Troy, NY 12180
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Abstract

Multiparticle diffusion equations were modeled to simulate the dynamics of phase coarsening. Local environmental information and particle interactions within the microstructure are included in our simulations. These studies reveal that the growth rates of particles with the same radii can differ, and that particles with the average radius can grow, shrink, or remain conditionally stable. These results are in contrast to mean-field predictions, where particle growth rates are strictly deterministic. Multiparticle simulations prove that fluctuations occur in the particle growth rates, even at extremely low microstructural densities. Multiplicative noise provides a good basis to describe microstructural fluctuations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 731: Symposium W – Modeling and Numerical Simulation of Materials Behavior and Evolution , 2002 , W7.7
Copyright
Copyright © Materials Research Society 2002

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References

[1] Todes, O. M., J Phys. Chem. (Sov.), 20, 629 (1946).Google Scholar
[2] Lifshitz, I. M. and Slyozov, V. V., J. Phys. Chem. Solids, 19, 35 (1961).Google Scholar
[3] Wagner, C., Z. Elektrochem., 65, 581 (1961).Google Scholar
[4] Altkemper, J. et al, Phys. Rev. Lett., 82, 2725 (1999).Google Scholar
[5] Glicksman, M. E., Wang, K. G. and Marsh, S. P., J. Crystal Growth, 230, 318 (2001).Google Scholar
[6] Weins, J. and Cahn, J. W., Sintering and Related Phenomena, ed. Kuczynski, G. C. (Plenum, New York, 1973) pp.151–163.Google Scholar
[7] Voorhees, P. W. and Glicksman, M.E., Acta Metall., 32, 2013 (1984).Google Scholar
[8] Beenakker, C. W. J., Phys. Rev. A, 33, 4482 (1986).Google Scholar
[9] Akaiwa, N. and Voorhees, P. W., Phys. Rev. E, 49, 3860 (1994).Google Scholar
[10] Fradkov, V. E., Glicksman, M. E., and Marsh, S. P., Phys. Rev. E, 53 3925 (1996).Google Scholar
[11] Mandyam, H. et al., Phys. Rev. E, 58 2119 (1998).Google Scholar
[12] Glicksman, M. E., Wang, K. G. and Crawford, P., Computational Modeling of Materials, Minerals and Metals Processing, ed. Cross, Mark, (The Minerals, Metals & Materials Society, 2001) pp.703–713.Google Scholar
[13] Glicksman, M. E., Wang, K. G. and Crawford, P., Brazilian Journal of Materials Research, (accepted in 2001).Google Scholar
[14] Wang, K. G. et al, Z. Phys., 94, 353 (1994).Google Scholar
[15] Marsh, S. P. and Glicksman, M. E., Solidification, ed. Hofmeister, W. H. et al, (The Minerals, Metals & Materials Society, 1999) pp.229–238.Google Scholar
[16] Pande, C. S. and Rajagopal, A. K., Acta Mater., 49 1805 (2001).Google Scholar
[17] Marqusee, J. A. and Ross, J., J. Chem. Phys., 80 536 (1984).Google Scholar