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Multiple Scattering Calculations Applied to XAS: A Structure and Electronic Sensitive Tool

Published online by Cambridge University Press:  25 February 2011

Philippe Sainctavit  and
J. Petiau
Philippe Sainctavit
Affiliation:
Laboratoire de Minéralogie-Cristyallographie, CNRS UA 9, Universités Paris 6 et 7, Tour 16, 4 place Jussieu, 75252 Paris Cedex 05, France
J. Petiau
Affiliation:
Laboratoire de Minéralogie-Cristyallographie, CNRS UA 9, Universités Paris 6 et 7, Tour 16, 4 place Jussieu, 75252 Paris Cedex 05, France
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Abstract

We present an application of multiple scattering theory with “muffin-tin” potentials to the calculation of X-ray absorption cross section. We have measured and calculated the K-edge spectra of atoms in compounds with zincblende structure : SiC, ZnS. We show that some spectral features can be precisely related to the local environnement around the absorbing atom.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 253: Symposium V – Application of Multiple Scattering Theory to Materials Science , 1991 , 483
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

[1] Sainctavit, Ph., Petiau, J., Benfatto, M. and Natoli, C.R.. Conference Proceedings Vol. 25 “2nd European Conference on Progress in X-Ray Synchrotron Radiation Research”, Balerna, A, Bernieri, E., Mobilio, S. (Eds.), SIF, Bologna 1990 Google Scholar
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[4] Laffon, C.. Ph. D. Thesis, Universit6 Paris-Sud, march 1990.Google Scholar
[5] Sainctavit, Ph., Petiau, J., Benfatto, M. and Natoli, C.R.. Physica B, 158, 347(1989)Google Scholar