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Morphological Transition of Epitaxial Rhodium (111)

Published online by Cambridge University Press:  21 February 2011

Frank Tsui
Affiliation:
Department of Physics and Astronomy, University of North Carolina, Chapel Hill, NC 27599-3255, tsui@physics.unc.edu
Joanne Wellman
Affiliation:
Department of Physics, University of Michigan, Ann Arbor, MI 48109
Ctirad Uher
Affiliation:
Department of Physics, University of Michigan, Ann Arbor, MI 48109
Roy Clarke
Affiliation:
Department of Physics, University of Michigan, Ann Arbor, MI 48109
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Abstract

We report a global morphological transition in the nucleation and growth of epitaxial Rh (111). The transition occurs near 600 K, about 1/4 of the Rh melting temperature, and is signaled by a change in the shape of the surface features from fingered to compact. The transition appears to be related to a change in the critical nucleation size from 1 to 2 atoms. On both sides of the transition, there lies a regime of persistent layer-by-layer growth indicated by a minimum in surface roughness and by the presence of RHEED oscillations. The general surface features exhibit well defined length scales that are not self-affine, and as growth proceeds they increase in size following a power-law dependence on film thickness with a temperature-independent exponent of 0.33 ± 0.03. The results suggest a general pathway to the layer-by-layer growth of close-packed metals.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1 Ehrlich, G. and Hudda, F.G., J. Chem. Phys. 44, 1039 (1966); R. L. Schwoebel, J. Appl. Phys. 40, 614 (1969).Google Scholar
2 Villain, J., J. Phys. I France 1, 19 (1991).Google Scholar
3 Johnson, M. D., Orme, C., Hunt, A. W., Graff, D., Sudijono, J. L., Sander, L. M., and Orr, B. G., Phys. Rev. Lett. 72, 116 (1994); C. Orme, M. D. Johnson, J. L. Sudijono, K. T. Leung, and B. G. Orr, Appl. Phys. Lett. 64, 860 (1994).Google Scholar
4 Ernst, H. J., Fabre, E., Folkerts, R., and Lapujoulade, J. L., Phys. Rev. Lett. 72, 112 (1994); J. Vac. Sci. Tech. A 12, 1 (1994).Google Scholar
5 van Nostrand, J., Chey, S. J., Hasan, M. A., Cahill, D. G., and Greene, J. E., Phys. Rev. Lett. 74, 1127 (1995).Google Scholar
6 Stroscio, J. A., Pierce, D. T., Stiles, M. and Zangwill, A., Phys. Rev. Lett. 75, 4246 (1995).Google Scholar
7 Hunt, A. W., Orme, C., Williams, D. R. M., Orr, B. G., and Sander, L. M., Europhys. Lett. 27, 611 (1994); in Scale Invariance, Interfaces and Non-Equilibrium Dynamics, ed. by A. J. McKane (Plenum, NY, 1994).Google Scholar
8 Siegert, M. and Plischke, M., Phys. Rev. Lett. 73, 1517 (1994); M. Siegert in Scale Invariance, Interfaces and Non-Equilibrium Dynamics, ed. by A. J. McKane (Plenum, NY, 1994).Google Scholar
9 Barlett, D., Snyder, C. W., Orr, B. G., and Clarke, R., Rev. Sci. Instr. 62, 1263 (1991); data acquisition using KSA300, k-Space Assoc. Inc., Ann Arbor, MI 48104.Google Scholar
10 Tsui, F., Han, P. D. and Flynn, C. P., Phys. Rev. B 47, 13648 (1993).Google Scholar
11 Jacobsen, J., Jacobsen, K., Stoltze, P., and Nørskov, J. K., Phys. Rev. Lett. 74, 2295 (1995).Google Scholar
12 Kunkel, R., Poelsema, B., Verheij, L. L., and Comsa, G., Phys. Rev. Lett. 65, 733 (1990)Google Scholar
13 Tersoff, J., van der Gon, A. W. D. and Tromp, R. M., Phys. Rev. Lett. 72, 266 (1994).Google Scholar
14 Röder, H., Bromann, K., Brune, H., and Kern, K., Phys. Rev. Lett. 74, 3217 (1995).Google Scholar
15 Stroscio, J. A., Pierce, D. T. and Dragoset, R. A., Phys. Rev. Lett. 70, 3615 (1993).Google Scholar
16 Stroscio, J. A. and Pierce, D. T., Phys. Rev. B 49, 8522 (1994).Google Scholar
17 Amar, J. G. and Family, F., Phys. Rev. Lett. 74, 2066 (1995).Google Scholar
18 Bales, G. S. and Chrzan, D. C., Phys. Rev. B 50, 6057 (1994).Google Scholar
19 Bartelt, M. C. and Evans, J. W., Phys. Rev. B 46, 12675 (1992).Google Scholar
20 Ratsch, C., Zangwill, A., Smilauer, P., and Vvedensky, , Phys. Rev. Lett. 72, 3194 (1994).Google Scholar
21 Venables, J. A., Phil. Mag. 27, 697 (1973).Google Scholar
22 Ayrault, G. and Ehrlich, G., J. Chem. Phys. 60, 281 (1974).Google Scholar
23 Tsui, F., Wellman, J., Uher, C., and Clarke, R., unpublished.Google Scholar