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Microwave System Design and Dielectric Property Measurements

Published online by Cambridge University Press:  15 February 2011

Wayne R. Tinga
Wayne R. Tinga*
Affiliation:
Department of Electrical Engineering, University of Alberta, Edmonton, Alberta, Canada T6G 2G7
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Abstract

In high temperature microwave systems, property variations of the process material can cover orders of magnitude causing significant changes in microwave coupling efficiency, heating rate, impedance matching, field strength and penetration depth. We created some first-order, temperature dependent models of these system parameters for a number of materials and calculated typical values over the temperature range of 0–1000 C. The results show that the input impedance of a resonator, the relative energy dissipation the power density and the penetration depth in the process material are strongly influenced by the temperature dependent dielectric constant. Process control algorithms require models of the system parameters and hence our models are useful for automated microwave processing systems. Moreover, it is shown that the relative dielectric loss factor of the process material can be monitored via the reflection coefficient of the microwave resonator containing the material.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 347: Symposium O – Microwave Processing of Materials IV , 1994 , 427
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

1. Pozar, D.M., Microwave Engineering, Addison-Wesley, 1990.Google Scholar
2. Tian, B.Q. and Tinga, W.R., “Single Frequency Relative Q Measurements Using Perturbation Theory”, IEEE Trans. Microwave Theory Tech., 41(11), pp 1922–1927, 1993.Google Scholar
3. Tian, B.Q., Tinga, W.R., “Linearity Condition Between a Cavity's Q-factor and Its Input Resonant Resistance”, IEEE-MTT, 5mms pages Submitted Feb 22, 1994.Google Scholar
4. Tinga, W.R. and Xi, W., “Design of a New High-Temperature Dielectrometer System”, Journal of Microwave Power & Electromagnetic Energy, 28(2), p 93–103, 1993.Google Scholar
5. Xi, W. and Tinga, W.R., “Error Analysis and Permittivity Measurements With Reentrant High-Temperature Dielectrometer”, Journal of Microwave Power & Electromagnetic Energy, 28(2), p 104–112, 1993.Google Scholar
6. Xi, W., High Temperature Microwave Dielectrometer, Ph.D. Thesis, Department of Electrical Engineering, University of Alberta, Edmonton, Alberta, Canada, 1992.Google Scholar
7. Tinga, W.R., “Microwave Material Interactions and Process Design Modeling”, Ceramic Trans. Vol 36, pp 29–43, 1993.Google Scholar
8. Metaxas, A.C. and Meredith, R.J., Industrial Microwave Heating, IEE Power Engineering Series 4, Peter Peregrinus, Ltd, 1988.Google Scholar
9. James, C.R., Tinga, W.R., Voss, W.A.G., “Some Factors Affecting the Energy Conversion in a Microwave Cavity”, Journal of Microwave Power, Vol. 1, pp. 97–107, Dec. 1966.Google Scholar
10. James, C.R., Tinga, W.R., Voss, W.A.G., “Energy Conversion in Closed Microwave Cavities”, Microwave Power Engineering, Vol. 2, pp. 28–37, Academic Press, New York, Edited by Okress, E.C., 1968.Google Scholar
11. Tinga, W.R., “Rapid High Temperature Measurement of Microwave Dielectric Properties”, Mater. Res. Soc. Proc. 269, pp 505–516, 1992.Google Scholar
12. Xi, W. and Tinga, W.R., “Field Analysis of New Coaxial Dielectrometer”, IEEE Trans. Microwave Theory Tech., 40,(10), pp 1927–1934, 1992.Google Scholar
13. Hutcheon, R.M., Dejong, M.S. and Adams, F.P., “System For Rapid Measurements of RF and Microwave Properties up to 1400 C; parts 1 and 2, J. Of Microwave Power and Electromagnetics, pp 87–102, 1992. 347–2Google Scholar