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Microstructure-Controlled Multilayer PZT Actuators: Effects of Cyclic Actuation on Crystallographic Structure

Published online by Cambridge University Press:  01 February 2011

Jens Müller ,
Stephanie A. Hooker  and
Davor Balzar
Jens Müller
Affiliation:
jmueller@boulder.nist.gov, NIST Boulder, Materials Reliability Division, 325 Broadway, Boulder, Colorado, 80305-3328, United States, 303-497-7065, 303-497-5030
Stephanie A. Hooker
Affiliation:
shooker@boulder.nist.gov, NIST Boulder, Materials Reliability Division, United States
Davor Balzar
Affiliation:
balzar@du.edu, University of Denver, Department of Physics and Astronomy, United States
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Abstract

In this study, multilayered PbTixZr1-xO3 (PZT) samples (produced at sintering temperatures in the range of 1175 °C to 1325 °C) were electrically fatigued by long-term exposure (∼106 cycles) to electric fields, and the parameters of initial and remnant polarization were estimated. Changes in the crystallographic microstructure as a function of sintering temperature Ts were examined by scanning electron microscopy (SEM) and X-ray diffraction (XRD) to gain insight on fatigue mechanisms and their prevention. Results showed that domain wall movement was facilitated in samples processed at TS less than 1250 °C, and that such samples were more resistant to electrical fatigue.

Keywords

piezoelectricmicrostructurefatigue
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 888: Symposium V – Materials and Devices for Smart Systems II , 2005 , 0888-V08-03
Copyright
Copyright © Materials Research Society 2006

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References

REFERENCES

[1] Pölzl, H., and Brzozowski, E., CFI-Ceram. Forum Int. 82(4), E37 (2005).Google Scholar
[2] http://piezocenter.com/standardmaterial.htm (2005).Google Scholar
[3] Tagantsev, A. K., Stolichnov, I., Colla, E. L., and Setter, N., J. Appl. Phys. 90(3), 1378 (2001).Google Scholar
[4] Täffner, U., Carle, V., and Schäfer, U., ASM Handbook Volume 9: Metallography and Microstructures, ASM International (2004) pp. 1.Google Scholar
[5] ICSD Data Base Entry, Pb(Zr0.52Ti0.48)O3-[P4MM] Ragini, R., Ranjan, R., and Mishra, S. K., http://icsdweb.fiz-karlsruhe.de (2002).Google Scholar
[6] Cohen, M. U., Rev. Sci. Instr. 6, 68 (1935).Google Scholar
[7] Balzar, D., J. Appl. Cryst. 28, 244 (1995). Programs SHADOW, SLH, and BREADTH are available from http://www.du.edu/~balzar/lbap.htm.Google Scholar
[8] Balzar, D. in Defect and Microstructure Analysis by Diffraction, edited by Snyder, R. L., Bunge, H. J., and Fiala, J., (International Union of Crystallography Monographs on Crystallography No. 10, Oxford University Press, New York 1999) pp. 94.Google Scholar
[9] Hooker, S., Müller, J., Kostelecky, C., and Womer, K., Journal of Intelligent Material Systems and Structures, (accepted for publication July 2005).Google Scholar
[10] Randall, C. A., Kim, N., Kucera, J. P., Cao, W., and Shrout, T. R., J. Am. Ceram. Soc. 81(3), 667 (1998).Google Scholar
[11] Darlington, C. N., and Cernik, R. J., J. Phys.: Condens. Matter 1, 6019 (1989).Google Scholar
[12] Fotinich, Y., and Carman, G. P., J. Appl. Phys. 88(11), 6715 (2000).Google Scholar