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Microstructure of Thin Film Photoconductors and its Correlation with Optical and Electronic Properthss

Published online by Cambridge University Press:  15 February 2011

U. Klement ,
D. Horst  and
F. Ernst
U. Klement
Affiliation:
Max - Planck Institut für Metallforschung, Seestrasse 92,70174 Stuttgart, Germany
D. Horst
Affiliation:
Institut für Netzwerk- und Systemtheorie, Universität Stuttgart, Pfaffenwaldring 47, 70550 Stuttgart, Germany
F. Ernst
Affiliation:
Max - Planck Institut für Metallforschung, Seestrasse 92,70174 Stuttgart, Germany
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Abstract

The objective of this work is to find a material to replace amorphous hydrogenated silicon used as photosensitive part in the “retina” of an “electronic eye”. For that reason, ZnS, ZnSe, CdS and CdSe were chosen for investigations. Thin films, prepared by chemical vapour deposition, were characterized by transmission electron microscopy. The observed microstructures were correlated with the optoelectronic properties of these materials. CdSe was found to be the most promising material for our application. Hence, the influence of a dielectric interlayer and the effects of additional annealing treatments were analyzed for CdSe and will be discussed with respect to the optimization of the material.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 452 , 1996 , 925
Copyright
Copyright © Materials Research Society 1997

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References

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