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Microstructure Evolution in Charged Particle Irradiated 316 SS Modified to Reduce Radiation Damage

Published online by Cambridge University Press:  21 March 2011

J. Gan
Affiliation:
Pacific Northwest National Laboratory, Richland, WA 99352, USA
E. P. Simonen
Affiliation:
Pacific Northwest National Laboratory, Richland, WA 99352, USA
D. J. Edwards
Affiliation:
Pacific Northwest National Laboratory, Richland, WA 99352, USA
S. M. Bruemmer
Affiliation:
Pacific Northwest National Laboratory, Richland, WA 99352, USA
B. H. Sencer
Affiliation:
The University of Michigan, Ann Arbor, MI 48109, USA
L. Fournier
Affiliation:
The University of Michigan, Ann Arbor, MI 48109, USA
G. S. Was
Affiliation:
The University of Michigan, Ann Arbor, MI 48109, USA
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Abstract

The objective of this work is to investigate the addition of misfit elements in both size and mass on the evolution of irradiated microstructure in 316 SS. Alloys were modified by the addition of Pt and Hf to suppress the radiation damage. Pt and Hf were added as a lattice perturbation to catalyze defect recombination within the early stage of cascade formation and defect migration. Irradiations were conducted with 5 MeV Ni-ions at 500 °C to doses up to 50 dpa or with 3.2 MeV protons at 400 °C. Microstructures were characterized using transmission electron microscopy. While no beneficial effect was seen for Pt addition, Hf appears to effectively alter the microstructural response to irradiation.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

[1] Ziegler, J. F., Biersack, J. P., Littmark, U., The Stopping and Range of Ions in Solids, Pergaamon, Oxford, 1985 Google Scholar
[2] Damcott, D., Cookson, J., Rotberg, V. and Was, G.S., Nucl. Instr. Meth. B99 (1995) 780 Google Scholar
[3] Gan, J., Ph. D dissertation, The University of Michigan, 1999 Google Scholar
[4] Kato, Takahiko et al. , J. Nucl. Mater. 189 (1992) 167174 Google Scholar
[5] , Ohnuki et al. , 19th Inter. Sympo., ASTM STP 1366, Hamilton, M.L., Kumar, A.A. S., Rosinki, S.T., and Grossbeck, M.L., Eds., American Society for Testing and Materials, West Conshohocken, PA, 2000.Google Scholar