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Microstructure and Thermoelectric Properties of p-Type Bi0.5Sb1.5Te3 and n-Type Bi2Te2.7Se0.3 Films Deposited by Pulsed Laser Ablation

  • Raghuveer S. Makala (a1), K. Jagannadham (a1), B.C. Sales (a2) and Hsin Wang (a3)


Thin films of p-type Bi0.5Sb1.5Te3, n-type Bi2Te2.7Se0.3 and n-type with SbI3 doping were deposited on mica substrates using Nd-YAG pulsed laser ablation at temperatures ranging from 300°C to 500°C. These films were characterized using X-ray diffraction, SEM and TEM. X-ray mapping and EDS were used to determine the composition. The films showed uniform thickness and high crystalline quality with a preferred (00n) alignment with the substrates. The film quality in terms of composition and crystal perfection is studied as a function of growth temperature. It was found that films deposited at 350°C gave improved crystallinity and thermoelectric characteristics. The Seebeck coefficient, electrical resistivity and Hall mobility were measured as a function of temperature and compared with the measurements on the bulk. Correlation of thermoelectric properties with microstructure is discussed.



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1. Weise, J. R. and Muller, L., J. Phys. Chem. Solids 15, 13 (1960)
2. Völklein, F. et al. : Thin Solid Films 187, 1990, p253262.
3. Mzerd, A. et al. : J. Mat. Sci. Lett. 13, 1994, p301304.
4. Stölzer, M. et al. , 15th International Conference on Thermoelectrics, 1996, p. 422.
5. Chrisey, D.B. and Hubler, G.K., Eds., Pulsed Laser Deposition of Thin Films, (Wiley, New York, 1994)
6. Tedenac, J.C., Corso, S. Dal, Hadioux, A., Charar, S., Liautard, B., MRS Sym. Proc., Vol.545, p93, 1998.


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