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Microstructural Characterization of an Oriented Silicalite Film

Published online by Cambridge University Press:  10 February 2011

M. C. Lovallo  and
M. Tsapatsis
M. C. Lovallo
Affiliation:
Department of Chemical Engineering, University of Massachusetts Amherst, Amherst, MA, 01003
M. Tsapatsis*
Affiliation:
Department of Chemical Engineering, University of Massachusetts Amherst, Amherst, MA, 01003
*
* Corresponding Author
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Abstract

The crystal orientation of a submicron silicalite membrane is examined using standard x-ray diffraction and pole-figure analyses. Results indicate that the crystals in the molecular sieving layer are preferentially oriented with both straight and sinusoidal channel networks of the zeolite parallel to the membrane surface. This requires that transport across the membrane proceed down the c-axis of the crystals which can occur by jumping between the two channel networks. EDAX data confirms that the molecular sieving layer is the pure silica zeolite silicalite.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 454: Symposium S – Advanced Catalytic Materials–1996 , 1996 , 161
Copyright
Copyright © Materials Research Society 1997

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References

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