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Microraman Study of PbTiO3 Thin Film Prepared by Sol-Gel Technique

Published online by Cambridge University Press:  15 February 2011

E. Ching-Prado ,
A. Reynés-Figueroa ,
R. S. Katiyar ,
S. B. Majumder  and
D. C. Agrawal
E. Ching-Prado
Affiliation:
Department of Physics, University of Puerto Rico, San Juan, P.R. 00931.
A. Reynés-Figueroa
Affiliation:
Department of Physics, University of Puerto Rico, San Juan, P.R. 00931.
R. S. Katiyar
Affiliation:
Department of Physics, University of Puerto Rico, San Juan, P.R. 00931.
S. B. Majumder
Affiliation:
Indian Institute of Technology, Kanpur, India.
D. C. Agrawal
Affiliation:
Indian Institute of Technology, Kanpur, India.
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Abstract

A PbTiO3 thin film prepared on silicon substrate by sol-gel technique has been studied by micro-Raman spectroscopy. The spectra, in comparison to the single crystal work, show high background in the low frequency region and Raman lines are broader, thus revealing the polycrystalline nature of the film. The frequencies of the Raman bands in the film are clearly shifted to lower frequencies compared to the corresponding ones in the single crystal or powder forms. This phenomenon is similar to the hydrostatic pressure effect on the Raman lines of PbTiO3 single crystal. The film, therefore, has grains under stress. This stress is caused by non-equilibrium defects and diffusion at the interface. Measurements at different film positions showed variation in the frequency and width of the Raman bands which are associated with the stress and grain size inhomogeneities. The measured shift in the Raman frequencies suggest grain sizes ≤l μm. XRD indicates grain size around 22 nm.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 343: Symposium H – Polycrystalline Thin Films - Structure, Texture, Properties and Applications , 1994 , 469
Copyright
Copyright © Materials Research Society 1994

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References

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