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The Methods of Investigation of Complex Dielectric Permittivity of Layer Polymers Containing Conductive Inclusions

Published online by Cambridge University Press:  22 February 2011

A.A. Kalachev
Affiliation:
Institute for High Temperatures, Academy of Science USSR, Izhorskaya 13/19, Moscow, 127412, USSR.
I.V. Kukolev
Affiliation:
Institute for High Temperatures, Academy of Science USSR, Izhorskaya 13/19, Moscow, 127412, USSR.
S.M. Matitsin
Affiliation:
Institute for High Temperatures, Academy of Science USSR, Izhorskaya 13/19, Moscow, 127412, USSR.
L.N. Novogrudskiy
Affiliation:
Institute for High Temperatures, Academy of Science USSR, Izhorskaya 13/19, Moscow, 127412, USSR.
K.N. Rozanov
Affiliation:
Institute for High Temperatures, Academy of Science USSR, Izhorskaya 13/19, Moscow, 127412, USSR.
A.K. Sarychev
Affiliation:
Institute for High Temperatures, Academy of Science USSR, Izhorskaya 13/19, Moscow, 127412, USSR.
A.V. Seleznev
Affiliation:
Institute for High Temperatures, Academy of Science USSR, Izhorskaya 13/19, Moscow, 127412, USSR.
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Abstract

A set of methods for measure complex dielectric permittivity of layer materials at microwaves is suggested. These methods allow one to measure dielectric permittivity of composite materials in with the mean size of inhomogeneities is comparable with the wavelength and materials with high dielectric permittivity.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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References

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