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Metal-ZnO Interfaces Studied by High Resolution Transmission Electron Microscopy

  • J.Th.M. De Hosson (a1), W. P. Vellinga (a1), H. B. Groen (a1) and B. J. Kooi (a1)

Abstract

This paper reports on investigations of Ag-ZnO and Cu-ZnO interfaces, produced by internal oxidation. ZnO precipitates with the wurtzite structure were found showing mainly one orientation relationship (OR) with the matrix. However, closely related ORs were found, rotated by small angles from that orientation relation. The atomic structure of several interfaces surrounding these precipitates was studied and compared using high resolution transmission electron microscopy. This paper focuses on interfaces between low index facets of ZnO and vicinal planes of Ag. These interfaces clearly show relaxations. An interpretation of these relaxations in terms of dissociation of partial dislocations at the interface is put forward.

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5. De Hosson, J.Th.M., Vellinga, W., Zhou, X.B., Vitek, V., in: Stability of Materials, eds, Gonis, A., Turchi, P., Kudrnovsky, J., Plenum, New York, 1996, p. 581.

Metal-ZnO Interfaces Studied by High Resolution Transmission Electron Microscopy

  • J.Th.M. De Hosson (a1), W. P. Vellinga (a1), H. B. Groen (a1) and B. J. Kooi (a1)

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