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Metal Overlayers on Self-Organized Molecular Assemblies: X-ray Photoelectron Spectroscopy of CR/CM and NI/CM on 12-Nercaptododecanenitrile

  • D. R. Jung (a1) and A. W. Czanderna (a1)

Abstract

Overlayers of Cr and Ni deposited at 22 °C and at -100 °C onto self-organized molecular assemblies of HS(CH2 )11 CN on Au have been studied by X-ray photoelectron spectroscopy (XPS). For the lowest overlayer coverages, the C ls and N is core levels show evidence for a chemical interaction between the deposited metal and the CN end-group. At 22 °C and for coverages of 0.6 nm or more, Cr/CN shows a C ls low binding energy, carbide-like shoulder. The degree of metal penetration is assessed based on the attenuation of the C ls and Au 4f intensities, and on the positions of the Cr and Ni 2p levels. In general, the least penetration and the largest binding energy shifts of the C, N, and the Cr or Ni core levels are observed for Cr/CN, while and Ni/CN shows smaller shifts and greater penetration.

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