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Magnetoresistance in Thin Films of Silver Chalcogenides

Published online by Cambridge University Press:  10 February 2011

I.S. Chuprakov ,
V.B. Lyalikov ,
K.-H. Dahmen  and
P. Xiong
I.S. Chuprakov
Affiliation:
Chemistry Department and MARTECH, Florida State University, Tallahassee, FL 32306
V.B. Lyalikov
Affiliation:
Chemistry Department and MARTECH, Florida State University, Tallahassee, FL 32306
K.-H. Dahmen
Affiliation:
Chemistry Department and MARTECH, Florida State University, Tallahassee, FL 32306
P. Xiong
Affiliation:
Physics Department and MARTECH, Florida State University, Tallahassee, FL 32306
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Abstract

Oriented and non-oriented thin films of silver(I) telluride, Ag2Te, were prepared by e-beam evaporation, vapor transport technique and Chemical Vapor Deposition (CVD). Crystallinity and orientation of the films were studied by Θ−2Θ XRD, rocking curve and pole figure measurements. The origin and conditions for the oriented growth are discussed. Special microdevice was prepared by photolitography from the oriented films of Ag2Te in order to investigate magnetoresistance (MR) in this material. It was proved that the reported earlier negative MR in Ag2Te films is a completely geometrical effect, which can be observed using non-linear arrangement of current and voltage contacts.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 602: Symposium JJ – Magnetoresistive Oxides & Related Materials , 1999 , 47
Copyright
Copyright © Materials Research Society 2000

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