Hostname: page-component-76fb5796d-zzh7m Total loading time: 0 Render date: 2024-04-26T10:10:32.329Z Has data issue: false hasContentIssue false

Magneto-Optical Properties of Multilayered FePt for High Density Recording

Published online by Cambridge University Press:  01 February 2011

Hojun Ryu
Affiliation:
Basic Research Laboratory, Electronics and Telecommunication Research Institute 161 Gajeong-Dong, Yuseong-Gu, Daejeon 305–350, Korea
Dongwoo Suh
Affiliation:
Basic Research Laboratory, Electronics and Telecommunication Research Institute 161 Gajeong-Dong, Yuseong-Gu, Daejeon 305–350, Korea
Yongwoo Park
Affiliation:
Basic Research Laboratory, Electronics and Telecommunication Research Institute 161 Gajeong-Dong, Yuseong-Gu, Daejeon 305–350, Korea
Eunkyung Kim
Affiliation:
Basic Research Laboratory, Electronics and Telecommunication Research Institute 161 Gajeong-Dong, Yuseong-Gu, Daejeon 305–350, Korea
Yonggoo Yoo
Affiliation:
Basic Research Laboratory, Electronics and Telecommunication Research Institute 161 Gajeong-Dong, Yuseong-Gu, Daejeon 305–350, Korea
Woosug Jung
Affiliation:
Basic Research Laboratory, Electronics and Telecommunication Research Institute 161 Gajeong-Dong, Yuseong-Gu, Daejeon 305–350, Korea
Mun Cheol Paek
Affiliation:
Basic Research Laboratory, Electronics and Telecommunication Research Institute 161 Gajeong-Dong, Yuseong-Gu, Daejeon 305–350, Korea
Get access

Abstract

The Si3N4/FePt/Si3N4/Al/Si structures have been fabricated. 57 nm silicon nitride films have been used as dielectric layer for heat dissipation and 500 nm Al film used for reflection layer. The Kerr rotation angle was changed with the FePt layer thickness. At the 65 % Pt composition in 10 nm FePt layer, the maximum Kerr rotation angle was 0.82°. As increase with FePt thickness the Kerr angle is slightly decreased. The change of Kerr rotation angle and the thermal behavior of multilayered structure according to FePt thickness variation were also calculated by computer simulation.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1) Farrow, R. F. C., Weller, D., Marks, R. F., Toney, M. F., Cebollada, A., Harp, G. R., J. Appl. Phys., 79, 5967 (1996).Google Scholar
2) Cebollada, A., Weller, D., Sticht, J., Harp, G. R., Farrow, R. F. C., Marks, R. F., Savoy, R., Scott, J. C., Phys. Rev. B., 50, 3419 (1994).Google Scholar
3) Perlov, Y., Ebert, H., Yaresko, A. N., Antonov, V. N. and Weller, D., Solid State Commun. 105, 273 (1998).Google Scholar
4) Mansuripur, M., J. Appl. Phys., 67, 6466 (1990).Google Scholar
5) Mansuripur, M., Neville Connell, G. A., and Goodman, Joseph W., Appl. Optics., 21, 1106 (1982).Google Scholar
6) Suh, D., Park, Y., Ryu, H., Sohn, Y., Paek, M., J. Magn. Magn. Mater., 272–276, 2299 (2004).Google Scholar