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Magnetic Circular Dichroism And X-Ray Absorption Near Edge Structure Studies Of Magnetoresistive Oxides

Published online by Cambridge University Press:  15 February 2011

S. M. Mini
Affiliation:
Northern Illinois University, Department of Physics, DeKalb, IL 60115 Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
John Mitchell
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
D. G. Hinks
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
C. W. Kimball
Affiliation:
Northern Illinois University, Department of Physics, DeKalb, IL 60115 Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
P. A. Montano
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439 Dept. of Physics, University of Illinois, Chicago, IL 60680
P. Lee
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
D. Rosenmann
Affiliation:
Northern Illinois University, Department of Physics, DeKalb, IL 60115 Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
A. V. Tkachuk
Affiliation:
Northern Illinois University, Department of Physics, DeKalb, IL 60115
A. Udani
Affiliation:
Northern Illinois University, Department of Physics, DeKalb, IL 60115
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Abstract

We report the results of temperature dependent, Mn K-edge X-ray Absorption measurements: Magnetic X-ray Circular Dichroism (MXCD) for local magnetic properties and X-ray Absorption Near Edge (XANES) for electronic and structural properties of Mn-based oxide magnetoresistive compounds La1−xSrxMnO3. This is the first report of an MXCD signal of the Mn K-edge in Mn oxide systems. By studying the integrated peak intensity of the first peak in the MXCD signal, it can be determined that the magnetic properties of the system are independent of temperature in the range 94 to 223K.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

1. Asamitsu, A., Moritomo, Y., Tomioka, Y., Arima, T., and Tokura, Y., Nature 373, 407 (1995).Google Scholar
2. Urushibara, A., Moritomo, Y., Arima, T., Asamitus, A., Kido, G., and Tokura, Y Phys. Rev B 51, 14103 (1995).Google Scholar
3. Mitchell, John, et al., Phys. Rev. B (1996) in press.Google Scholar
4. Helmolt, R. von, Wecker, J., Samwer, K., Haupt, L., and Barner, K., J. Appl. Phys. 76, 6925 (1994).Google Scholar
5. Chainani, A., Matthew, M., and Sarma, D. D., Phys. Rev. B 47, 15397 (1993).Google Scholar
6. Schtitz, G., Wagner, W., Wilhem, W., Kienle, P., Zeller, R., Fraham, R., Materlik, G., Phys. Rev. Lett. 58, 737 (1987), and G. Schtitz and R. Wienke, Hyperfine Interactions 50, 457 (1989).Google Scholar
7. Stdihler, S., Schtitz, G., Ebert, H., Phys. Rev. B 47, 818 (1993).Google Scholar
8. Carra, P. and Altarelli, M., Phys. Rev. Lett. 64, 1286 (1990).Google Scholar
9. Thole, B.T., Carra, P., Sette, F., and Laan, G. van der, Phys. Rev. Lett. 68, 1943 (1992).Google Scholar
10. Lee, P.L., Beno, M.A., Jennings, G., Ramanathan, M., Knapp, G.S., Huang, K., Bai, J., Montano, P.A., Rev. Sci. Instrum. 65, 1 (1994).Google Scholar
11. Alp, E.E., Goodman, G.L., Soderholm, L., Mini, S. M., Ramanathan, M., Shenoy, G.K. and Bommannavar, A.S., J. Phys.: Condens. Matter 1 6463 (1989).Google Scholar
12. Mini, S.M., Fullerton, E.E., Fontaine, A., Sowers, C.H., Bommannavar, A.S., Traverse, A., Baudelet, F., and Pizzini, S., Mat. Res. Soc. 375, 87 (1995).Google Scholar
13. Pizzini, S., Fontaine, A., Dartyge, E., Giorgetti, C., Baudelet, F., Kappler, J.P., Boher, P. and Giron, F., Phys Rev. B 50, 3779 (1994).Google Scholar
14. Schtitz, G., Frahm, R., Mautner, P., Wienke, R., Wagner, W., Wilhelm, W., and Kienle, P., Phys. Rev. Lett. 62, 2620 (1989).Google Scholar