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Low Voltage Point Projection Microscopy and Time of Flight Stm - Two New Microscopies

  • J.C.H. Spence (a1), W. Qian (a1), W. Lo (a1), S. Mo (a1), U. Knipping (a1) and X. Zhang (a1)...

Abstract

The design of a low voltage point-projection field-emission transmission electron microscope is described and images showing 0.7nm resolution at 100 volts are given. A scheme for low voltage reflection electron holography from bulk samples in UHV is outlined. A new STM is described which allows atomic clusters to be transferred onto the tip, then introduced into a time-of-flight analyser for species identification.

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Low Voltage Point Projection Microscopy and Time of Flight Stm - Two New Microscopies

  • J.C.H. Spence (a1), W. Qian (a1), W. Lo (a1), S. Mo (a1), U. Knipping (a1) and X. Zhang (a1)...

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