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Low Voltage Point Projection Microscopy and Time of Flight Stm - Two New Microscopies

Published online by Cambridge University Press:  21 February 2011

J.C.H. Spence ,
W. Qian ,
W. Lo ,
S. Mo ,
U. Knipping  and
X. Zhang
J.C.H. Spence
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287., USA
W. Qian
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287., USA
W. Lo
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287., USA
S. Mo
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287., USA
U. Knipping
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287., USA
X. Zhang
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287., USA
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Abstract

The design of a low voltage point-projection field-emission transmission electron microscope is described and images showing 0.7nm resolution at 100 volts are given. A scheme for low voltage reflection electron holography from bulk samples in UHV is outlined. A new STM is described which allows atomic clusters to be transferred onto the tip, then introduced into a time-of-flight analyser for species identification.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 405
Copyright
Copyright © Materials Research Society 1994

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References

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