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Low Temperature Laser-Doping Process Using PSG and BSG Films for Poly-Si TFTs

  • Cheon-Hong Kim (a1), Sang-Hoon Jung (a1), Jae-Hong Jeon (a1) and Min-Koo Han (a1)

Abstract

A simple low-temperature excimer-laser doping process employing phosphosilicate glass (PSG) and borosilicate glass (BSG) films as dopant sources is proposed in order to form source and drain regions for polycrystalline silicon thin film transistors (poly-Si TFTs). We have successfully controlled sheet resistance and dopant depth profile of doped poly-Si films by varying PH3/SiH4 flow ratio, laser energy density and the number of laser pulses. The penetration depth and the surface concentration of dopants were increased with increasing laser energy density and the number of laser pulses. The minimum sheet resistance of 450ω/ for phosphorus (P) doping and 1100ω/ for boron (B) doping were successfully obtained. Our experimental results show that the proposed laser-doping process is suitable for source/drain formation of poly-Si TFTs.

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References

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1. Hack, M., Mei, P., Lujan, R. and Lewis, A. G., JNCS 164–166, 727730 (1993).
2. Sera, K., Okumura, F., Kaneko, S., Itoh, S., Hotta, K. and Hoshino, H., J. Appl. Phys. 67, 2359, (1990).
3. Sameshima, T., Tomita, H. and Usui, S., Jpn. J. Appl. Phys. 27, L1935–L1937 (1988).
4. Guist, G. K. and Sigmon, T. W., IEEE Electron Device Lett. 18, 394 (1997).
5. Inui, S., Nii, T. and Matumoto, S., IEEE Electron Device Lett. 12, 702 (1991).

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