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Low Energy Ne Scattering Spectroscopy for Insulators, and Materials in the Electric/Magnetic Fields

  • Kenji Umezawa (a1), Shigemitsu Nakanishi (a2), Hideki Hayashi (a2), Hideaki Higashitsutsumi (a2), Hiroki Nagasawa (a2), Eisuke Narihiro (a2) and Keiko Ogai (a3)...

Abstract

This study describes a low-energy atom scattering system that was combined with a time-of-flight spectrometer for insulator surface structural analysis. We show one example. MgO(001) crystal was used to study the surface analysis technique and is illustrated here. Insulator surface structure is difficult to study because of the charging effects during electron or ion-beam bombardment. Nevertheless, structural analysis of insulator surfaces is very important in fundamental research as well as in technology fields.

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[1] Smith, D. P., J. Appl. Phys. 38, 340 (1967).
[2] Katayama, M., Nomura, E., Kanekuma, N., Soejima, H., Aono, M., Nucl. Instr. Meth. B 33, 857 (1988).
[3] Sumitomo, K., Oura, K., Katayama, I., Shoji, F., Hanawa, T., Nucl. Instrum. Meth. B 33, 871 (1988).
[4] Yoshimoto, M., Maeda, T., Shimozono, K., Koinuma, H., Shinohara, M., Ishiyama, O. and Ohtani, F., Appl. Phys. Lett. 65, 3197 (1994).
[5] Umezawa, K., Nakanishi, S., Kojima, K., Yoshimura, M., Ueda, K., Gibson, W. M., Phys. Rev. B 63, 035402 (2001).
[6] Rabalis, J. W., Low Energy Ion Surface Interactions, (Wiley, 1994).

Keywords

Low Energy Ne Scattering Spectroscopy for Insulators, and Materials in the Electric/Magnetic Fields

  • Kenji Umezawa (a1), Shigemitsu Nakanishi (a2), Hideki Hayashi (a2), Hideaki Higashitsutsumi (a2), Hiroki Nagasawa (a2), Eisuke Narihiro (a2) and Keiko Ogai (a3)...

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