Hostname: page-component-848d4c4894-v5vhk Total loading time: 0 Render date: 2024-06-22T04:55:52.614Z Has data issue: false hasContentIssue false
  • English
  • Français

Long-Term Cathodoluminescent Characterization of Thin-Film Oxide Phosphors in a Wide Range of Electron Excitation Densities

Published online by Cambridge University Press:  21 March 2011

Vyacheslav D. Bondar ,
Thomas E. Felter ,
Charles E. Hunt ,
Yuri G. Dubov  and
Andrei G. Chakhovskoi
Vyacheslav D. Bondar
Affiliation:
Lviv National University, Department of Physics, 50 Dragomanov Str., 79005, Lviv, Ukraine
Thomas E. Felter
Affiliation:
Lawrence Livermore National Laboratory, PO Box 808, L - 356, Livermore, CA, 94550
Charles E. Hunt
Affiliation:
University of California at Davis, Department of Electric and Computer Engineering, Davis, CA, 95616
Yuri G. Dubov
Affiliation:
Lviv National University, Department of Physics, 50 Dragomanov Str., 79005, Lviv, Ukraine
Andrei G. Chakhovskoi
Affiliation:
University of California at Davis, Department of Electric and Computer Engineering, Davis, CA, 95616
Get access

Abstract

Long-term processes of cathodoluminescence degradation of thin film phosphors Zn2SiO4:Ti and Zn2GeO4:Mn were investigated in a wide range of e-beam energies, current and power densities. The time dependencies describing the decreasing of emission intensity have been found. At higher current densities of e-beam irradiation, the specific behavior of long-term degradation processes was observed, which is characterized by rapid initial degradation and a slower long term decrease. The most probable mechanisms are proposed for long-term processes of degradation in the investigated phosphors.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 667: Symposium G – Luminescence and Luminescent Materials , 2001 , G7.4
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Bondar, V., Grytsiv, M., Groodzinsky, A., Vasyliv, M., Chakhovskoi, A., Hunt, C., Mali-nowsky, M., and Felter, T., J. Electrochem.Soc. 144, 704 (1997).Google Scholar
2. Bondar, V., Materials Science and Engineering B. 69, 505 (2000).Google Scholar
3. Bondar, V., Materials Science and Engineering B. 70, 510 (2000).Google Scholar
4. Pfanhl, A., Bell. System. Technolog. 42, 181 (1963).Google Scholar
5. Joseph, Shmulovich, Information Display 3, 17 (1989).Google Scholar
6. Widdel, H., and Post, D., Color in Electronic Displays, Plenium Press, NY 1992, p. 242.Google Scholar
7. Seager, C. H., Zvadil, K. R., Talant, D. R., Warren, W. L.. Proc. The Third International Conference on the Science and Technology of Display Phosphors. Huntington Beach, CA. Nov. 3-5, 1997, pp. 325–326.Google Scholar
8. Holloway, P.E., Thomes, W.J., Abrams, B., Jones, S., Williams, L., The Effectr of Surfaces on FED Phosphors//Proc. The Seventh International Display Workshop (IDW'00).-Kobe (Japan).-November 29-December 1, 2000.-P.837–840.Google Scholar
9. Donofrio, R. L., Proc. Electrochemical Society, May, 1981, pp. 381–382 Google Scholar
10. Bondar, V., Popovich, S., Dubov, Yu., Felter, T.. Proc. The Fifth International Conference on the Science and Technology of Display Phosphors. San Diego, CA. Nov. 8-10, 1999, pp. 329–332.Google Scholar
11. Bondar, V. and Vasyliv, M., Ukrainian patent No. 18151 A, 01.07.97.Google Scholar
12. Klinger, M. I., Emtsev, V. V., Mashovets, T. V., Ryvkin, S. M., Vitovskii, N. A., Radiation Effects 56, 229 (1981).Google Scholar
13. Hersh, H. N., J. Electrochem. Soc. 118, 144C (1971).Google Scholar
14. Lang, D. V., Ann. Rev. Mater. Sci. 12, 377 (1982).Google Scholar
15. Vinnetskii, V. L., Yaskovets, E. E., Kelman, E. V., in Physical processes in crystal with defects, (Institute of Physics of Ukraine Academic Science Publishers, Kiev, 1972), p. 122 (in Russian).Google Scholar
16. Klaer, J., Braugnig, D., Wulf, F., Second European Conference on Radiation and its effects on Components amd System, Saint-Malo, France, Sept. 13-16, 1993, pp.146–153.Google Scholar
17. Scoggan, G. A., Ma, T. P., J. Appl. Phys. 52, 6231 (1981).Google Scholar