Skip to main content Accessibility help
×
Home

Lattice-Fringe Fingerprinting: Structural identification of nanocrystals by HRTEM

  • Moeck Peter (a1) and Ruben Bjorge (a2)

Abstract

A novel method for the structurally identification of a nanocrystal from a single high resolution (HR) transmission electron microscopy (TEM) micrograph is described. Components of this method are demonstrated on both experimental and simulated HRTEM images. On the experimental side, the structural information that can be extracted from a HRTEM image is the projected reciprocal lattice geometry, the plane symmetry group, a few structure factor amplitudes and phases, and an outline of the projected atomic structure to the limited resolution of the HRTEM (via a Fourier synthesis of the structure factors). Searching for this information in a comprehensive database and matching it with high figures of merit to that of candidate structures should allow for highly discriminatory identifications of nanocrystals, even without additional chemical information as obtainable in analytical TEMs.

Copyright

References

Hide All
[1] Saltiel, C. and Giesche, H., J. Nanoparticle Res. 2 (2000) 325326.10.1023/A:1010090724447
[2] Faber, J. and Fawcett, T., Acta Cryst. B 58 (2002) 325332.10.1107/S0108768102003312
[3] Pérez, J.A. López et al. , J. Physic. Chem. B 101 (1997) 80458047.10.1021/jp972046t
[4] Pinna, N., Progr. Colloid. Polym. Sci. 130 (2005) 2932.
[5] Łjkowski, W. et al. (editors), Eighth Nanoforum Report: Nanometrology, 2006; http://www.nanoforum.org
[6] Bjorge, R., MSc thesis, Portland State University, May 9, 2007; Journal of Dissertation Vol. 1, Issue 1, 2007, http://www.scientificjournals.org/journals2007/j_of_dissertation.htm
[7] Moeck, P. et al. , Proc. NSTI-Nanotech Vol. 1 (2006) 741744; ISBN 0-9767985-6-5.
[8] Moeck, P. et al. , Proc. NSTI-Nanotech Vol.4 (2007) 9396; ISBN 1-4200637-6-6.
[9] http://nanocrystallography.research.pdx.edu/CIF-searchable
[10] http://crystallography.net
[11] Giacovazzo, C., Direct Phasing in Crystallography Fundamentals and Applications, Oxford University Press, 1998.
[12] Li, F.-H. and Tang, D., Acta Cryst. A 41 (1985) 376382.10.1107/S0108767385000800
[13] Tang, D. et al. , Acta Cryst. B 42 (1986) 340342.10.1107/S0108768186098130
[14] Peng, L.-M., Acta Cryst. A 56 (2000) 511518.10.1107/S0108767300007522
[15] Aert, S. Van et al. , Ultramicroscopy 107 (2007) 551558.10.1016/j.ultramic.2006.04.031
[16] Hovmöller, S. et al. , Nature 311 (1984) 238241.10.1038/311238a0
[17] Hu, J.J. et al. , Ultramicroscopy 41 (1992) 387397.10.1016/0304-3991(92)90218-9
[18] Carlsson, A. et al. , Angew. Chem. Int. Ed. 37 (1998) 12171220.10.1002/(SICI)1521-3773(19980518)37:9<1217::AID-ANIE1217>3.0.CO;2-D
[19] Dorset, D.L., Structural Electron Crystallography, Plenum, 1995.10.1007/978-1-4757-6621-9
[20] Zou, X., Ph.D. thesis, Stockholm University, 1995.
[21] Bail, A. Le, Powder Diffraction 20 (2005) 316326.
[22] Malm, J.-O. and O'Keefe, M.A., Ultramicroscopy 68 (1997) 1323.10.1016/S0304-3991(97)00005-3
[23] Ruijter, W.J. de, J. Computer-Assisted Microsc. 6 (1994) 195212.
[24] Fraundorf, P. et al. , J. Appl. Phys. 98 (2005) 14308–1-1-10; arXiv:cond-mat/0212281v210.1063/1.2135414
[25] Ruijter, W.J. de et al. , Ultramicroscopy 57 (1995) 409422.
[26] Moeck, P. and Fraundorf, P., Zeitschrift für Kristallographie 222 (2007) 634645; expanded version: arXiv:0706.2021
[27] Hovmöller, S., Ultramicroscopy 41 (1992) 121135.10.1016/0304-3991(92)90102-P
[28] Lovely, G.R. et al. , Appl. Phys. Lett. 88 (2006) 093124093126.10.1063/1.2175481
[29] http://www.felmi-zfe.tugraz.at/dm_scripts/dmscript1.html
[30] Zuo, J.M. and Mabon, J.C., Microsc. Microanal. 10 (Suppl 2) (2004) 10001001; http://emaps.mrl.uiuc.edu/
[31] Marks, L.D. and Sinkler, W., Microsc. Microanal. 9 (2003) 399410.
[32] Hu, J.J. and Tanaka, N., Ultramicroscopy 90 (1999) 15.10.1016/S0304-3991(99)00080-7
[33] Sinkler, W. and Marks, L.D., J. Micros. 194 (1999) 112123.
[34] Sha, B.D. et al. , Acta Cryst. A 49 (1993) 877880.10.1107/S0108767393004581

Keywords

Lattice-Fringe Fingerprinting: Structural identification of nanocrystals by HRTEM

  • Moeck Peter (a1) and Ruben Bjorge (a2)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed