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Lattice-Fringe Fingerprinting: Structural identification of nanocrystals by HRTEM

Published online by Cambridge University Press:  01 February 2011

Moeck Peter  and
Ruben Bjorge
Moeck Peter
Affiliation:
pmoeck@pdx.edu, Portland State University, Physics, P.O.Box 751, Portland, OR, 97207-0751, United States
Ruben Bjorge
Affiliation:
bjorger@pdx.edu, Portland State University, Physics, P.O.Box 751, Portland, OR, 97207-0751, United States
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Abstract

A novel method for the structurally identification of a nanocrystal from a single high resolution (HR) transmission electron microscopy (TEM) micrograph is described. Components of this method are demonstrated on both experimental and simulated HRTEM images. On the experimental side, the structural information that can be extracted from a HRTEM image is the projected reciprocal lattice geometry, the plane symmetry group, a few structure factor amplitudes and phases, and an outline of the projected atomic structure to the limited resolution of the HRTEM (via a Fourier synthesis of the structure factors). Searching for this information in a comprehensive database and matching it with high figures of merit to that of candidate structures should allow for highly discriminatory identifications of nanocrystals, even without additional chemical information as obtainable in analytical TEMs.

Keywords

transmission electron microscopy (TEM)crystallographic structurestructural
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1026: Symposium C – Quantitative Electron Microscopy for Materials Science , 2007 , 1026-C17-10
Copyright
Copyright © Materials Research Society 2008

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