Hostname: page-component-76fb5796d-vfjqv Total loading time: 0 Render date: 2024-04-27T04:40:50.727Z Has data issue: false hasContentIssue false

Kink and Crack Interfaces in Deformed 6H-SiC Single Crystals

Published online by Cambridge University Press:  15 February 2011

X. J. Ning
Affiliation:
Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, Ohio 44106-7204, U.S.A.
P. Pirouz
Affiliation:
Department of Materials Science and Engineering, Case Western Reserve University, Cleveland, Ohio 44106-7204, U.S.A.
Get access

Abstract

When a 6H-SiC single crystal is deformed under indentation or uniaxial compression in orientations not favorable for the activation of the 1/3[1120](0001) easy glide system, the secondary slip system is activated. Additionally, for low- temperature deformations, “kinks” and/or micro-cracks form in the crystal. In this paper, experimental results on relatively lowtemperature compression and indentation tests of single crystal 6H-SiC, and the microstructure of the deformed crystals, are presented. Based on the results, the secondary slip system in 6HSiC has been determined to be 1/3[1120](1100), which may actually be a combination of alternate glide of 1/3[1120] dislocations on the (1102) and (1102) planes. Further, dislocation mechanisms for the nucleation of prism-plane and basal-plane cracks, and for the process of kinking, in deformed 6H-SiC are proposed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Fujita, S., Maeda, K. and Hyodo, S., Philos. Mag. A 55, 203 (1987).Google Scholar
2. Yang, J. W., Suzuki, T., Pirouz, P., Powell, J. A. and Iseki, T., in Wide Band Gap Semiconductors, edited by Moustakas, T. D., Pankove, J. I. and Hamakawa, Y. (Materials Research Society 242, Pittsburgh, 1992), pp. 531536.Google Scholar
3. Pirouz, P. and Yang, J. W., Ultramicroscopy 51, 189214 (1993).Google Scholar
4. Suematsu, H., Suzuki, T., Iseki, T. and Mori, T., J. Am. Ceram. Soc. 74, 173178 (1991).Google Scholar
5. Yang, J. W. and Pirouz, P., J. Mater. Res. 8, 29022907 (1993).Google Scholar
6. Maeda, K., Suzuki, K., Fujita, S., Ichihara, M. and Hyodo, S., Philos. Mag. A 57, 573592 (1988).Google Scholar
7. Duval-Riviere, M. L. and Vicens, J., Philos. Mag. 69, 451470 (1994).Google Scholar