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Kinetics of Photodeposition of Superconducting Films

Published online by Cambridge University Press:  01 January 1992

C. H. Chen
Affiliation:
Oak Ridge National Laboratory, P. O. Box 2008, Oak Ridge, TN 37831–6378
R. C. Phillips
Affiliation:
Oak Ridge National Laboratory, P. O. Box 2008, Oak Ridge, TN 37831–6378
P. W. Morrison
Affiliation:
Advanced Fuel Research, 87 Church Street, E. Hartford, CT 06108
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Abstract

Kinetics of photodeposition of superconducting films was studied by using real time in-situ monitoring of gas phase species with mass spectrometry and thin-film properties by Fourier Transform Infrared (FTIR) spectrometry. A mass spectrometer was used to study wavelength and power dependent desorbed atoms and molecules during laser ablation process. FTIR was used to monitor the surface properties of thin film. Real time surface temperatures can be easily obtained by FTIR. By combinging mass spectrometry and FTIR, an optimum condition of making high-quality superconducting film can possibly be found.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Bednorz, J. G. and Miller, K. A., Z. Phys. B64, 189 (1986).Google Scholar
2. Wu, M. K., Ashburn, J. R., Torng, C. J., Hor, P. H., Meng, R. L., Gao, L., Huang, Z. T., Wang, Y. Q., and Chu, C. W., Phys. Rev. Lett. 58 908 (1987).Google Scholar
3. Chen, C. H., Payne, M. G., Hurst, G. S., Kramer, S.D., Allman, S. L., and Phillips, R. C., in Lasers and Mass Spectrometry edited by Lubman, D. M. (Oxford University Press, 1990), pp. 1–37.Google Scholar
4. Ready, J. F., Effect of High Power Laser Irradiation (Academic Press, New York, 1971), pp. 172–174.Google Scholar
5. Ying, Q. Y., Kim, S.H., Shaw, D. T., and Kwok, H. S., Appl. Phys. Lett. 55, 1041 (1989).Google Scholar
6. Zheng, Z. Q., Ying, Q. Y., Witanachchi, S., Huang, Z. O., Shaw, D. T., and Kwok, H. S., Appl. Phys. Lett. 54, 954 (1989).Google Scholar