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Ion-Assisted Deposition of Protective Overlayers for Magneto-Optic Alloys

Published online by Cambridge University Press:  25 February 2011

Kenneth D. Cornett ,
Ursula J. Gibson  and
Anthony Taylor
Kenneth D. Cornett
Affiliation:
Optical Sciences Center. University of Arizona, Tucson, AZ 85721.
Ursula J. Gibson
Affiliation:
Optical Sciences Center. University of Arizona, Tucson, AZ 85721.
Anthony Taylor
Affiliation:
Optical Sciences Center. University of Arizona, Tucson, AZ 85721.
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Abstract

Rare-Earth Transition-Metal alloys such as Tb-Fe-Co are being studied and used as magneto-optic data storage materials. These materials are susceptible to oxidation by either oxygen or water vapor, particularly the rare earth component. Pitting corrosion is also a problem when protective overlayers have pinholes or a porous microstructure. Both degradation mechanisms are significant for application of this material to optical data storage. We have used ion assisted deposition (IAD) to produce protective overlayers of refractory oxides, such as Al2O2 and ZrO2. These layers were deposited both with and without IAD onto iron films and exposed to environments with controlled temperature and humidity. A scanning micro-reflectometer capable of detecting micrometer-sized pinholes was used to monitor the degradation of the iron layer with exposure time.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 128: Symposium A – Processing and Characterization of Materials Using Ion Beams , 1988 , 495
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

(1) Harper, J.M.E., Cuomo, J.J., Gambino, R.J., and Kaufman, H.R., Ion Bombardment Modification of Surfaces, edited by Auciello, O., and Kelly, R. (Elsevier, Amsterdam 1984).Google Scholar
(2) Martin, P.J., J. Mat. Sci. 21, 1 (1986).CrossRefGoogle Scholar
(3) Gibson, U.J., Physics of Thin Films, vol.13, edited by Francombe, M.H. and Vossen, J.L (Academic Press, San Diego, 1997), pp. 109–150.Google Scholar
(4) Sainty, W.G., Netterfield, R.P., Martin, P.J., Applied Optics 23, 1116 (1984).10.1364/AO.23.001116CrossRefGoogle Scholar
(5) Cornett, K.D., Gibson, U.J., Rev. Sci. Instrum. 59, 1341 (1988).10.1063/1.1139719Google Scholar
(6) Targove, J.D., Lingg, L.J., Lehan, J.P., Macleod, H.A., Applied Optics_, (1988).Google Scholar
(7) Hwangbo, C.K., Lingg, L.J., et al, Applied Optics (accepted for publication).Google Scholar
(8) Ralls, Courtney, Wulff, An Introduction to Material Science and Engineering, (Wiley, Ney York, 1976), pp. 288–292.Google Scholar
(9) Lingg, L.J., Hwangbo, C.K., et al, Technical Digest of the Topical Meeting on Optical Interference Coatings, Tucson, AZ. 1988, ThB10, (Optical Society of America, 1988).Google Scholar
(10) Himel, M. D., Microstructure effects on light propagation in zinc sulfide thin film waveguides, (Ph. D. Dissertation, University of Arizona 1988), pp. 107–115Google Scholar