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Kumar, A., Bakhru, H., Haberl, A. W., Carpio, R. A., and Ricci, A., Characterization of fluorinated silicon dioxide films by nuclear reaction analysis and optical techniques, AIP Conf.Proc. (USA), no.392, pt.1, p. 697–700
Lanford, W., Handbook of Modern Ion Beam Material Analysis, edited by Natasi, Michael, Materials Research Society
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Tomozawa, M., Han, Won-Taek; Lanford, W. A., Water entry into silica glass during slow crack growth, Journal of the American Ceramic Society, vol.74, no.10, p. 2573–6.