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Investigations of Ultra-Thin Single Layer A-Si:H Films
Published online by Cambridge University Press: 15 February 2011
Abstract
Measurements are presented as direct evidence of tail states in ultra-thin a-Si:H single layer films. Including tail states in computer simulations completely removes the staircase structure in the differential optical spectra, previously associated with the quantum confinement of carriers.
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- Copyright © Materials Research Society 1997