Hostname: page-component-8448b6f56d-sxzjt Total loading time: 0 Render date: 2024-04-18T20:44:43.141Z Has data issue: false hasContentIssue false

Investigation of Titanium Germanide Formation by Raman Scattering and X-Ray Absorption Spectroscopy

Published online by Cambridge University Press:  25 February 2011

D.B. Aldrich
Affiliation:
Department of Physics, North Carolina State University, Raleigh, N.C. 27595-8202
C.L. Jahncke
Affiliation:
Department of Physics, North Carolina State University, Raleigh, N.C. 27595-8202
R.J. Nemanich
Affiliation:
Department of Physics, North Carolina State University, Raleigh, N.C. 27595-8202
D.E. Sayers
Affiliation:
Department of Physics, North Carolina State University, Raleigh, N.C. 27595-8202
Get access

Abstract

The reactions of titanium on germanium were studied using Raman spectroscopy and X-ray Absorption Spectroscopy (XAS). Samples used in this study were produced in a custom MBE system with dual E-gun sources, two filament sources, and base pressure <1x10−10 Torr. Ge(100) substrates were prepared by chemical cleaning and homoepitaxial deposition of 500Å - 1000Å Ge at 550°C. Ti was deposited and subsequently annealed at 50°C intervals from 500°C to 700°C. Raman and XANES spectra of the titanium germanides were obtained and used to examine the.evolution of the crystalline structures which form by the interface reactions of Ti on Ge. A low-order phase formed by diffusion controlled growth prior to the formation of TiGe2 (isomorphous with TiSi2 [C54]) by nucleation controlled growth.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Ozturk, M.C., Grider, D.T., Wortman, J.J., Littlejohn, M.A., and Zhong, Y., J. Elec. Mat. 19 (10), 1129 (1990)Google Scholar
[2] Aldrich, D.B., Fiordalice, R.W., Jeon, H., Islam, Q., Nemanich, R.J., Sayers, D.E., Mat. Res. Soc. Symp. Proc. 159,167 (1989).Google Scholar
[3] Beyers, R., and Sinclair, R., J. Appl Phys., 57, 5240 (1985)CrossRefGoogle Scholar
[4] Nemanich, R.J., Fulks, R.T., Stafford, B.L., and VanderPlas, H.A., J. Vac. Sci. Technol., A3, 938 (1985).CrossRefGoogle Scholar
[5] Thomas, O., D'Heurle, F.M., Delage, S., and Scilla, G., App. Surf. Sci.,38, 27, (1989)Google Scholar
[6] Lytle, F.W., Greegor, R.B., Sandstrom, D.R., Marques, E.C., Wong, J., Spiro, C.L., Huffman, G.P., and Huggins, F.E., Nucl. Instr. and Meth., 226, 542, (1984)CrossRefGoogle Scholar
[7] Koningsberger, D.C., and Prins, R., X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS, and XANES. New York, John Wiley & Sons, Inc., 1988 Google Scholar