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The Investigation of Preferred Orientation Growth of ZnO Films on the Ceramic Substrates

  • Sheng-Yuan Chu (a1), Te-Yi Chen (a1), Walter Water (a2) and Tung-Yi Huang (a3)

Abstract

Poly-crystal ZnO films with c-axis (002) orientation have been successfully grown on the lead-based ceramic substrates by r.f. magnetron sputtering technique. The deposited films were characterized as a function of deposition time and argon-oxygen gas flow ratio. Crystalline structures of the films were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). Highly oriented films with c-axis normal to the substrates can be obtained by depositing under a total pressure of 10mTorr containing 50% argon and 50% oxygen and r.f. power of 70W for 3 hours. The phase velocity, electromechanical coupling coefficient and temperature coefficient of frequency of SAW device with ZnO/IDT/PT-ceramic structure were investigated. It shows that the preferred oriented ZnO film is beneficial for improving the electromechanical coupling coefficient of SAW device.

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*Corresponding author.Fax: 886-06-2345482 E-mail: chusy@mail.ncku.edu.tw

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Keywords

The Investigation of Preferred Orientation Growth of ZnO Films on the Ceramic Substrates

  • Sheng-Yuan Chu (a1), Te-Yi Chen (a1), Walter Water (a2) and Tung-Yi Huang (a3)

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