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Interplay of charge, orbital and magnetic order in Pr1−xCaxMnO3

Published online by Cambridge University Press:  10 February 2011

M. v. Zimmermann ,
J.P. Hill ,
Doon Gibbs ,
M. Blume ,
D. Casa ,
B. Keimer ,
Y. Murakami ,
Y. Tomioka  and
Y. Tokura
M. v. Zimmermann
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, New York 11973, USA
J.P. Hill
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, New York 11973, USA
Doon Gibbs
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, New York 11973, USA
M. Blume
Affiliation:
Department of Physics, Brookhaven National Laboratory, Upton, New York 11973, USA
D. Casa
Affiliation:
Department of Physics, Princeton University, New Jersey 08544, USA
B. Keimer
Affiliation:
Department of Physics, Princeton University, New Jersey 08544, USA Max-Planck-Institut für Festkörperforschung, 70569, Stuttgart, Germany.
Y. Murakami
Affiliation:
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, Tsukuba, 305-0801, Japan
Y. Tomioka
Affiliation:
Joint Research Center for Atom Technology (JRCAT), Tsukuba 305-0046, Japan
Y. Tokura
Affiliation:
Department of Applied Physics, University of Tokyo, Tokyo 113-0033, Japan and JRCAT
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Abstract

We report resonant x-ray scattering studies of charge and orbital order in Prl−xCaxMnO3 with x=0.4 and 0.5. Below the ordering temperature, To=245 K, the charge and orbital order intensities follow the same temperature dependence, including an increase at the antiferromagnetic ordering temperature, TN. High resolution measurements reveal, however, that long range orbital order is never achieved. Rather, an orbital domain state is formed. Above To, the charge order fluctuations are more highly correlated than the orbital fluctuations. We conclude that the charge order drives the orbital order at the transition.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 103
Copyright
Copyright © Materials Research Society 2000

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References

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