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Interfacial Characterization with Spectrum-Lines and Multivariate Statistical Analysis

Published online by Cambridge University Press:  10 February 2011

I. M. Anderson  and
J. Bentley
I. M. Anderson
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, Bldg. 5500, MS-6376, P O Box 2008, Oak Ridge, TN 37831–6376; ial@ornl.gov
J. Bentley
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, Bldg. 5500, MS-6376, P O Box 2008, Oak Ridge, TN 37831–6376; ial@ornl.gov
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Abstract

Changes in the electron energy-loss near-edge fine structure (ELNES) of the O-K and Co-L edges have been characterized in cobalt oxide in the vicinity of a boundary between periclase-(CoO) and spinel- (Co3O4) structured phases. The data were acquired with a conventional transmission electron microscope (CTEM) equipped with an imaging filter and operated in spectrum-line mode. Independent spectral features were identified by multivariate statistical analysis (MSA) of the raw data. The MSA of the spectrum-image acquired at the Co-L edge indicated a transition over ∼12 nm in the spectral features at the phase boundary. The variation of the ELNES at the O-K edge varied appreciably only in the interface region, whereas that at the Co-L edge also indicated subtle gradients in both phases adjacent to the interface area. These gradients are consistent with a change in the average oxidation state of the cobalt cations in the vicinity of the interface. A second independent component of the ELNES was also identified at the Co-L edge. Possible interpretations of this second component are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 458: Symposium W – Interfacial Engineering for Optimized Properties , 1996 , 81
Copyright
Copyright © Materials Research Society 1997

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References

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