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Interface Structure of Epitaxial Nb Films on Sapphire: Grazing Incidence X-Ray Diffraction and X-Ray Reflectivity Studies

  • C. H. Lee (a1), K. S. Liang (a1), F. S. Shieu (a2), S.L. Sass (a2) and C. P. Flynn (a3)...

Abstract

The interface structure of MBE grown Nb films on sapphire substrates was studied using grazing incidence x-ray diffraction and x-ray reflectivity measurements. Specifically, the use of these x-ray techniques in probing the buried interfaces was demonstrated. Diffraction effects were observed which are consistent with the presence of misfit dislocations in the interface.

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Interface Structure of Epitaxial Nb Films on Sapphire: Grazing Incidence X-Ray Diffraction and X-Ray Reflectivity Studies

  • C. H. Lee (a1), K. S. Liang (a1), F. S. Shieu (a2), S.L. Sass (a2) and C. P. Flynn (a3)...

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