Interface Conduction between Conductive ReO3 Thin Film and NdBa2Cu3O6 Thin Film
-
- DOI: https://doi.org/10.1557/PROC-751-Z5.7
- Published online by Cambridge University Press: 11 February 2011
Abstract
The Re oxide films were deposited on quartz glasses by RF reactive sputtering from a Re metal target. The lowest resistivity was observed in the film in-situ annealed at 200?C in Ar atmosphere and showed the order of 10-4 Ωcm of which the value was still about 10 times as large as that of a single crystal ReO3. The temperature dependence of the resistivity revealed a metallic behavior. A superconductivity did not take place in the bilayered film of ReO3 / NdBa2Cu3O6. In the interface region the resistivity minimum probably caused by the Kondo effect was observed in the neighborhood of 120K.
Copyright
COPYRIGHT: © Materials Research Society 2003
References
Interface Conduction between Conductive ReO3 Thin Film and NdBa2Cu3O6 Thin Film
-
- DOI: https://doi.org/10.1557/PROC-751-Z5.7
- Published online by Cambridge University Press: 11 February 2011
