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In-Situ Study of Radiation Damage in V2os Induced by Low Energy Electrons

  • R. Ai (a1), H.-J. Fan (a1), P.C. Stair (a1) and L.D. Marks (a1)


Radiation damage in V2Os induced by electrons in the energy range 0-3 keV has been studied by high resolution electron microscopy, X-ray photoelectron spectroscopy and mass spectrometry. Different phase transformations were observed when V205 was irradiated by electrons of different energies. The damage kinetics and the role of electron radiation enhanced diffusion were investigated. It was found that nucleation and growth of lower oxides was driven by electron radiation enhanced diffusion.



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