Hostname: page-component-76fb5796d-wq484 Total loading time: 0 Render date: 2024-04-25T20:33:07.246Z Has data issue: false hasContentIssue false

In Situ Surface Photovoltage Spectroscopy of ZnO Nanopowders Processed by Remote Plasma

Published online by Cambridge University Press:  31 January 2011

Raul M. Peters
Affiliation:
R.M.Peters@tcu.edu, Texas Christian University, Department of Physics and Astronomy, Fort Worth, Texas, United States
Stephen P. Glancy
Affiliation:
sglancy@trinity.edu, Trinity University, Department of Engineering Science, San Antonio, Texas, United States
J. Antonio Paramo
Affiliation:
antonio.paramo@tcu.edu, Texas Christian University, Department of Physics and Astronomy, Fort Worth, Texas, United States
Yuri M. Strzhemechny
Affiliation:
Y.Strzhemechny@tcu.edu, Texas Christian University, Department of Physics and Astronomy, Fort Worth, Texas, United States
Get access

Abstract

In many instances the quality of the surface in ZnO nanoscale systems is a key performance-defining parameter. The surface itself could be a very significant source of lattice defects as well as contaminating impurities, and this influence may extend into the sub-surface vicinity. In our work, key element of the surface analysis is the surface photovoltage (SPV) spectroscopy known for its advantages, such as: identification of conduction vs. valence band nature of the defect-related transitions and the defect level positions within the band gap, ability to measure relatively low densities of surface defects as well as their cross sections. Additional information can be obtained from the SPV transient measurements. In our system, SPV characterization is run in high vacuum, complemented by in situ remote plasma treatment. This combination of surface-sensitive and surface-specific tools is well-suited for studying surface properties with a high degree of reliability since there is no exposure to common air contaminants between processing and characterization cycles. We employed O/He remote plasma treatments of ZnO nanocrystalline surfaces. In situ SPV spectra and transient measurements of the as-received and processed samples revealed, on the one hand, a number of common spectral features in different ZnO nanopowder specimens, and, on the other hand, a noticeable plasma-driven changes in the surface defect properties, as well as in the overall electronic and optical surface characteristics.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Özgür, Ü., Alivov, Ya. I., Liu, C., Teke, A., Reshchikov, M. A., Doǧan, S., Avrutin, V., Cho, S.-J., and Morkoç, H., J. Appl. Phys. 98, 041301 (2005), and references therein.10.1063/1.1992666Google Scholar
2 Gao, P. X., Song, J., Liu, J., and Wang, Z. L., Adv. Mater. 19, 6772 (2007).10.1002/adma.200601162Google Scholar
3 Noh, H., Scharrer, M., Anderson, M. A., Chang, R. P. H., and Cao, H., Phys. Rev. B 77, 115136 (2008).10.1103/PhysRevB.77.115136Google Scholar
4 Zhang, Q., Chou, T. P., Russo, B., Jenekhe, S. A., and Cao, G., Angew. Chem. Int. Ed. 47, 24022406 (2008).10.1002/anie.200704919Google Scholar
5 Wang, Z. L., MRS Builletin 32, 109116 (2007).10.1557/mrs2007.42Google Scholar
6 Kronik, L. and Shapira, Y., Surface Science Reports 37, 1 (1999), and references therein.10.1016/S0167-5729(99)00002-3Google Scholar
7 Dember, H., Phys. Z. 32, 554 (1931).Google Scholar
8 Jing, L., Sun, X., Shang, J., Cai, W., Xu, Z., Du, Y., and Fu, H., Solar Energy Materials & Solar Cells 79, 133151 (2003).Google Scholar
9 Jing, L., Xu, Z., Sun, X., Shang, J., and Cai, W., Applied Surface Science 180, 308 (2001).10.1016/S0169-4332(01)00365-8Google Scholar
10 Lin, Y., Wang, D., Zhao, Q., Yang, M., and Zhang, Q., J. Phys. Chem. B 108, 3202 (2004).Google Scholar
11 Jing, L., Wang, B., Xin, B., Li, S., Shi, K., and Cai, W., Fu, H., Journal of Solid State Chemistry 177, 4221 (2004).10.1016/j.jssc.2003.10.034Google Scholar
12 Lin, Y., Wang, D., Zhao, Q., Li, Z., Ma, Y., and Yang, M., Nanotechnology 17, 2110 (2006).10.1088/0957-4484/17/9/006Google Scholar
13 Zhao, Q., Xie, T., Peng, L., Lin, Y., Wang, P., Peng, L., and Wang, D., J. Phys. Chem. C, 111, 17136 (2007).10.1021/jp075368yGoogle Scholar
14 Peters, R. M., Paramo, J. A., Quarles, C. A., and Strzhemechny, Y. M., “Correlation between optoelectronic and positron lifetime properties in as-received and plasma-treated ZnO nanopowders”, Application of Accelerators in Research and Industry, ed. McDaniel, F. D. and Doyle, B. L. (AIP, 2009) pp. 965969.Google Scholar
15 Paramo, J. A., Peters, R. M., Quarles, C. A., Vallejo, H., and Strzhemechny, Y. M., IOP Conf. Series: Materials Science and Engineering 6, 012030 (2009).10.1088/1757-899X/6/1/012030Google Scholar
16 Erhart, P., Albe, K., and Klein, A., Phys. Rev. B 73 205203 (2006).10.1103/PhysRevB.73.205203Google Scholar