Hostname: page-component-848d4c4894-sjtt6 Total loading time: 0 Render date: 2024-06-19T02:16:42.524Z Has data issue: false hasContentIssue false

Improved Yellow Light Emission in the Achievement of Dichromatic White Light Emitting Diodes

Published online by Cambridge University Press:  30 April 2013

Zhao Si
Affiliation:
Research and Development Center for Semiconductor Lighting, Institute of semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
Tongbo Wei
Affiliation:
Research and Development Center for Semiconductor Lighting, Institute of semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
Jun Ma
Affiliation:
Research and Development Center for Semiconductor Lighting, Institute of semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
Ning Zhang
Affiliation:
Research and Development Center for Semiconductor Lighting, Institute of semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
Zhe Liu
Affiliation:
Research and Development Center for Semiconductor Lighting, Institute of semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
Xuecheng Wei
Affiliation:
Research and Development Center for Semiconductor Lighting, Institute of semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
Xiaodong Wang
Affiliation:
Research and Development Center for Semiconductor Lighting, Institute of semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
Hongxi Lu
Affiliation:
Research and Development Center for Semiconductor Lighting, Institute of semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
Junxi Wang
Affiliation:
Research and Development Center for Semiconductor Lighting, Institute of semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
Jinmin Li
Affiliation:
Research and Development Center for Semiconductor Lighting, Institute of semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing 100083, People’s Republic of China
Get access

Abstract

A study about the achievement of dichromatic white light-emitting diodes (LEDs) was performed. A series of dual wavelength LEDs with different last quantum-well (LQW) structure were fabricated. The bottom seven blue light QWs (close to n-GaN layer) of the four samples were the same. The LQW of sample A was 3 nm, and that of sample B, C and D were 6 nm, a special high In content ultra-thin layer was inserted in the middle of the LQW of sample C and on top of that of sample D. XRD results showed In concentration fluctuation and good interface quality of the four samples. PL measurements showed dual wavelength emitting, the blue light peak position of the four samples were almost the same, sample A with a narrower LQW showed an emission wavelength much shorter than that of sample B, C, D. EL measurement was done at an injection current of 100 mA. Sample A only showed LQW emission due to holes distribution. Because of wider LQW, the emission wavelength of sample B, C and D was longer and peak intensity was weaker. Sample D with insert layer on top of LQW showed strongest yellow light emission with a blue peak. As the injection current increased, sample A showed highest output light power due to narrower LQW. Of the other three samples with wider LQW, sample D showed highest output power. Effective yellow light emission has always been an obstacle to the achievement of dichromatic white LED. Sample D with insert layer close to p-GaN can confine the hole distribution more effectively hence the recombination of holes and electrons was enhanced, the yellow light emission was improved and dichromatic white LED was achieved.

Type
Articles
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Mukai, T., Sugimoto, Y, and Kiyoku, H., Appl. Phys. Lett. 69, 4056 (1996).CrossRefGoogle Scholar
Qi, Y. D., Liang, H., Wang, D., Lu, Z. D., Tang, W., and Lau, K. M., Appl.Phys. Lett. 86, 101903 (2005).CrossRefGoogle Scholar
Ponce, F. A. and Bour, D. P., Nature 386, 351 (1997).CrossRefGoogle Scholar
Chang, S. J., Lai, W. C., Su, Y. K., Chen, J. F., Liu, C. H., and Liaw, U. H., IEEE J. Sel. Top. Quantum Electron. 8, 278 (2002).CrossRefGoogle Scholar
Detchprohm, T., Zhu, M., Zhao, W., Wang, Y., Li, Y., Xia, Y., and Wetzel, C., Phys. Status Solidi C 6, S840 (2009).CrossRefGoogle Scholar
Lai, Y. L., Liu, C. P., Lin, Y. H., Hsueh, Y. H., Lin, R. M., Lyu, D. Y., Peng, Z. X., and Lin, T. Y., Nanotechnology 17, 3734 (2006).CrossRefGoogle Scholar
Wang, L. S., Lu, Z. Q., Liu, S., and Feng, Z. C., J. Electron. Mater. 40, 1572 (2011).CrossRefGoogle Scholar
Qi, Y. D., Liang, H., Tang, W., Lu, Z. D., and Lau, K. M., J. Cryst. Growth. 272, 333 (2004).CrossRefGoogle Scholar
Yamada, M, Narukawa, Y., Tamaki, H., Murazaki, Y., and Mukai, T., IEICE Trans. Electron. E88-C, 1860 (2005).Google Scholar
Chen, H. S., Yeh, D. M., Lu, C. F., Huang, C. F., Lu, Y. C., Chen, C. Y., Huang, J. J., and Yang, C. C., Appl. Phys. Lett. 89, 093501 (2006).CrossRefGoogle Scholar
Damilano, B., Grandjean, N., Pernot, C., and Massies, J., Jpn. J. Appl. Phys. 40, L918 (2001).CrossRefGoogle Scholar
Yamada, M, Narukawa, Y., and Mukai, T., Jpn. J. Appl. Phys. 41, L246 (2002).CrossRefGoogle Scholar
Okamoto, K. and Kawakami, Y., IEEE J. Sel. Top. Quantum Electron. 15, 1199 (2009).CrossRefGoogle Scholar
Zhao, H., Zhang, J., Liu, G., and Tansu, N., Appl. Phys. Lett. 98, 151115 (2011).CrossRefGoogle Scholar
Jung, T., Lee, L. K., and Ku, P.C., IEEE J. Sel. Top. Quantum Electron. 15, 1073 (2009).CrossRefGoogle Scholar
Lee, W., Limb, J., Ryou, J.H., Yoo, D., Ewing, M. A., Korenblit, Y., and Dupuis, R. D., J. Disp. Technol. 3, 126 (2007).CrossRefGoogle Scholar
Chao, C. H., Chuang, S. L., and Wu, T. L., Appl. Phys. Lett. 89, 091116 (2006).CrossRefGoogle Scholar
McGroddy, K., David, A., Matioli, E., Iza, M., Nakamura, S., DenBaars, S., Speck, J. S., Weisbuch, C., and Hu, E. L., Appl. Phys. Lett. 93, 103502 (2008).CrossRefGoogle Scholar
Chhajed, S., Lee, W., Cho, J., Schubert, E. F., and Kim, J. K., Appl. Phys. Lett. 98, 071102 (2011).CrossRefGoogle Scholar
Chen, H. S., Yeh, D. M., Lu, C. F., Huang, C. F., Shiao, W. Y., Huang, J. J., Yang, C. C., Liu, I. S., and Su, W. F., IEEE Photonics Technol. Lett. 18, 1430 (2006)CrossRefGoogle Scholar
Wang, T., Nakagawa, D., Wang, J., Sugahara, T., and Sakai, S., Appl. Phys. Lett. 73, 3571 (1998).CrossRefGoogle Scholar
Wang, T., Bai, J., Sakai, S., and Ho, J. K., Appl. Phys. Lett. 78, 2617 (2001).CrossRefGoogle Scholar
Zhao, H., Liu, G., Zhang, J., Poplawsky, J. D., Dierolf, V., and Tansu, N., Optics Express. 19, A991 (2011).CrossRefGoogle Scholar
Che, S., Yuki, A., Watanabe, H., Ishitani, Y., and Yoshikawa, A., Appl. Phys. Express. 2, 021001 (2009)CrossRefGoogle Scholar