Hostname: page-component-7bb8b95d7b-wpx69 Total loading time: 0 Render date: 2024-09-11T10:15:53.121Z Has data issue: false hasContentIssue false

Imaging with Soft X-Rays

Published online by Cambridge University Press:  21 February 2011

D. M. Shinozaki*
Affiliation:
Department of Materials Engineering, The University of Western Ontario, London, Ontario, N6A 5B9, Canada
Get access

Abstract

A review of recent advances in soft X-ray imaging using synchrotron radiation is given.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Sayre, D., Kirz, J., Feder, R., Kim, D.M., Spiller, E., Ultramicroscopy 2, 337 (1977).CrossRefGoogle Scholar
2 Cheng, P.C., Shinozaki, D.M., Tan, K.H., in X-ray Microscopy: Instrumentation and Biological Applications, edited by Cheng, P.C. and Jan, G.J. (Springer-Verlag, Berlin, 1987), p. 65.CrossRefGoogle Scholar
3 Schmahl, G., Rudolph, D., X-ray Microscopy, (Springer-Verlag, Berlin, 1984).Google Scholar
4 Sayre, D., Howells, M., Kirz, J., Rarback, H., X-ray Microscopy II, (Springer-Verlag, Berlin, 1988).CrossRefGoogle Scholar
5 Kirz, J., Annals N.Y. Acad. Sci 342, 273 (1980).CrossRefGoogle Scholar
6 Shinozaki, D.M., Feder, R., Treatise on Materials Science and Technology 27, 111 (1988).Google Scholar
7 Nagel, D.J., IEEE Trans. Nucl. Sci. NS–26, 1228 (1979).Google Scholar
8 Epstein, H.M., Mallozzi, P.J., Campbell, B.E., Proc. SPIE 385, 141 (1983).Google Scholar
9 Hoffman, A. L, Albrecht, F.F., Crawford, E.A., Rose, P.H., Proc. SPIE 537, 198 (1985).CrossRefGoogle Scholar
10 Nagel, D.J., Brown, C., Peckarar, M., Ginter, M.L., Robinson, J., T.J. McIlrath, Appl Opt. 23, 1428 (1984).Google Scholar
11 Damerell, A., Madraszek, E., O'Neill, F., Rizvi, N., Rosser, R., Rumsby, P., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H., (Springer-Verlag, Berlin, 1988), p. 43.Google Scholar
12 Trebes, J., Brown, S., Campbell, E.M., Ceglio, N.M., Eder, D., Gaines, D., Hawryluk, A., Keane, C., London, R., McGowan, B., Mathews, D., Maxon, S., Nilson, D., Rosen, M., Stearns, D., Stone, G., Whelan, D., X-ray Microscopy II, p. 30.Google Scholar
13 Pearlman, J.S., Riordan, J.C., J. Vac. Sci. Technol. 19, 1190 (1981).Google Scholar
14 Neff, W., Eberle, J., Holz, R., Richter, R., Lebert, R. in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer- Verlag, Berlin, 1988), p. 22.CrossRefGoogle Scholar
15 Rarback, H., Shu, D., Feng, Su Cheng, Ade, H., Jacobsen, C., Kirz, J., McNulty, I., Vladimirsky, Y., Kern, D., Chang, P., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer- Verlag, Berlin, 1988), p. 194.CrossRefGoogle Scholar
16 Morrison, G. R., Browne, M.T., Buckley, C.J., Burge, R.E., Cave, R.C., Charalambous, P., Duke, P.J., Hare, A.R., Hills, C.P.B., Kenney, J.M., Michette, A.G., Ogawa, K., Rogoyske, A.M., Taguchi, T., X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer- Verlag, Berlin, 1988) p. 201.CrossRefGoogle Scholar
17 Niemann, B., Guttmann, P., Hilkenbach, R., Thieme, J., Meyer-Ilse, W., X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer- Verlag, Berlin, 1988), p. 209.Google Scholar
18 Rarback, H., Shu, D., Feng, S.C., Ade, H., Kirz, J., McNulty, I., Kern, D.P., Chang, T.H.P., Vladimirsky, Y., Iskander, N., Attwood, D., McQuaid, K., Rothman, S., Rev. Sci. Instrum. 59 (1), 52 (1988).Google Scholar
19 Bogli, V., Unger, P., Beneking, H., Greinke, B., Guttmann, P., Niemann, B., Rudolph, D., Schmahl, G., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 80.CrossRefGoogle Scholar
20 Buckley, C.J., Browne, M.T., Burge, R.E., Charalambous, P., Ogawa, K., Takeyoshi, T., X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 88.Google Scholar
21 Schmahl, G., Rudolph, D., Guttmann, P., Christ, O in X-ray Microscopy, edited by Schmahl, G., Rudolph, D. (Springer-Verlag, Berlin, 1984), p. 63.CrossRefGoogle Scholar
22 Michette, A.G., Optical Systems for Soft X-rays (Plenum Press, New York, 1986).Google Scholar
23 Niemann, B., Rudolph, D., Schmahl, G. Proc. SPIE 368, 2 (1982).Google Scholar
24 Niemann, B., Rudolph, D., Schmahl, G. Nucl. Instru. Meth. in Phys. Res. A 208, 367 (1983).Google Scholar
25 Spiller, E. in Handbook on Synchrotron Radiation 18, edited by Koch, E.E. (North Holland, New York, 1983), p.1091.Google Scholar
26 Spiller, E. in X-ray Microscopy, edited by Schmahl, G., Rudolph, D. (Springer-Verlag, Berlin, 1984), p. 226.Google Scholar
27 Cerrina, F., J. Imaging Science 30 (2), 80 (1986).Google Scholar
28 Shinozaki, D.M., Robertson, B.W. in X-ray Microscopy: Instrumentation and Biological Applications, edited by Cheng, P.C., Jan, G.J. (Springer- Verlag, Berlin, 1987) p. 105.Google Scholar
29 Shinozaki, D.M., Feder, R., Treatise on Materials Sc. and Technol. 27 (1988), 111.CrossRefGoogle Scholar
30 Schmahl, G., Rudolph, D., Guttman, P. in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 228.Google Scholar
31 Howells, M., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 263.Google Scholar
32 Sayre, D., Yun, W.B., Kirz, J., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 272.Google Scholar
33 Yun, W.B., Kirz, J., Acta Crysta. A43 (1987), p. 133.Google Scholar
34 Ade, H., Kirz, J., Rarback, H., Hulbert, S., Johnson, E., Kern, D., Chang, P., Vladimirsky, V., in X-ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., Rarback, H. (Springer-Verlag, Berlin, 1988), p. 280.Google Scholar