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Hrtem of Extended Defects in Tl-2212 Thin Films

Published online by Cambridge University Press:  15 February 2011

P. P. Newcomer
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
E. L. Venturini
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
H. Schöne
Affiliation:
Phillips Laboratory/VTMC, Kirtland AFB, NM 87117
B. L. Doyle
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185
K. E. Myers
Affiliation:
Dupont Superconductivity, Wilmington, DE 19880
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Abstract

Many applications of high temperature superconductors, HTS, require the presence of lattice defects in the material structure to suppress the motion of magnetic vortices and enhance the critical current density, Jc. The microstructure of Tl2Ba2CaCu2O8-δ (T1–2212) thin films which have extended defects induced by high energy Au and Cu ion irradiation is studied using high resolution transmission electron microscopy, HRTEM, with slow scan digital imaging. In order to optimize the HTS properties and better analyze the consequent microstructural modification, the fluence is varied. At moderate fluences, resulting in ∼4% reduction of the superconducting transition, large enhancements of Jc, and vortex pinning potential are observed. The density and microstructure of isolated defects and surrounding structure will be discussed and compared to damage profiles calculated using the TRIM code. Correlation will be made between the HRTEM results and the changes in HTS properties.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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