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Hrem Study of Ultra Thin Titanium Films

  • T. Braisaz (a1), P. Ruterana (a1), G. Nouet (a1), Ph. Komninou (a2), Th. Kehagias (a2), Th. Karakostas (a2), P. Poulopoulos (a2), M. Aggelakeris (a2), N. Flevaris (a2) and A. Serra (a3)...

Abstract

High resolution electron microscopy has been used to characterize the structure of ultra thin films of titanium deposited on KBr substrate by Ultra High Vacuum (UHV) electron-gun evaporation. The size of the grains has an order of magnitude of 10 nm whatever the substrate temperature. The observations have been carried out along <1123> zone axis. Some of the grains contain planar defects which were identified as the twin {1011}. The atomic structure of this twin is characterized by a mirror plane similar to that observed in polycrystalline titanium. Additionaly, this structure can be modified by a b2/2 twinning dislocation.

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Hrem Study of Ultra Thin Titanium Films

  • T. Braisaz (a1), P. Ruterana (a1), G. Nouet (a1), Ph. Komninou (a2), Th. Kehagias (a2), Th. Karakostas (a2), P. Poulopoulos (a2), M. Aggelakeris (a2), N. Flevaris (a2) and A. Serra (a3)...

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