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High-Temperature Dielectric Properties Measurements of Ceramics

Published online by Cambridge University Press:  25 February 2011

Shane Bringhurst
Affiliation:
University of Utah, Department of Electrical Engineering Salt Lake City, Utah 84112
Octavio M. Andrade
Affiliation:
University of Utah, Department of Electrical Engineering Salt Lake City, Utah 84112
Magdy F. Iskander
Affiliation:
University of Utah, Department of Electrical Engineering Salt Lake City, Utah 84112
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Abstract

This paper dicusses experimental arrangements, describes measurement techniques and presents experimental results for hightemperature broadband dielectric properties measurements of ceramics. The cavity perturbation technique and the open-ended coaxial line method are used in these experimental measurements. The design and construction details of cavities and probes are described and representative results of measurements on zirconia and alumina samples (green and sintered) are presented. Results of measurements made on insulating materials are shown. In general measurements are made in the frequency band 1 to 10 GHz and temperatures up to 1000°C.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

Reperences

1. Andrade, O.M., Iskander, M.F. and Bringhurst, S., “High-Temperature Broadband Dielectric Properties Measurement Techniques”, this issue.Google Scholar
2. Iskander, M.F. et.al., “Microwave Processing of Ceramics at the University of Utah-Description of Activities and Summary of Progress”,in Ceramic Transactions edited by Clark, D.E., Gac, F.D. and Sutton, W.H., Vol.21, 3548, The American Ceramic Society (1991).Google Scholar