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High-Resolution X-Ray Microstructural Study of Single Crystals of YBa2Cu3O7-y

Published online by Cambridge University Press:  28 February 2011

Hoydoo You ,
J. D. Axe ,
X. B. Kan ,
S. C. Moss ,
J. Z. Liu  and
D. J. Lam
Hoydoo You
Affiliation:
Physics Department, Brookhaven National Laboratory, Upton, NY 11973
J. D. Axe
Affiliation:
Physics Department, Brookhaven National Laboratory, Upton, NY 11973
X. B. Kan
Affiliation:
Department of Physics, University of Houston, Houston, TX 77004
S. C. Moss
Affiliation:
Department of Physics, University of Houston, Houston, TX 77004
J. Z. Liu
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
D. J. Lam
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
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Abstract

Single crystals of YBa2Cu3O7-y were studied by transmission Laue photography and monochromatic diffraction techniques, using the Cornell High Energy Synchrotron Source and a rotating anode x-ray source. A new type of twinning, with two orthorhombic domains rotated exactly 90 degree about the c axis, was observed in one sample and the conventional (110) type twinning in another sample with nominally identical growth conditions. A high resolution diffraction study of the sample with the conventional (110) twinning shows that measured orthorhombicity (proportional to oxygen ordering parameter) varies from one domain to another.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 99: Symposium AA – High-Temperature Superconductors , 1987 , 83
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCE

1. Wu, M.K., Ashburn, J.R., Torng, C.J., Hor, P.H., Meng, R.L., Gao, L., Huang, Z.J., Wang, Y.Q., and Chu, C.W., Phys. Rev. Lett. 58, 908 (1987).Google Scholar
2. You, H., McMullan, R.K., Axe, J.D., Cox, D.E., Liu, J.Z., Crabtree, G.W., and Lara, D.J., Solid State Coram. 64, 739 (1987);Google Scholar
Cox, D.E., Moodenbaugh, A.R., Hurst, J.J., and Jones, R.H., J. Phys. Chera. Solids, in press;Google Scholar
Capponi, J.J., Chaillout, C., Hewat, A.W., Lejay, P., Marezio, M., Nguyen, N., Raveau, B., Soubeyroux, J., Tholence, J.L., and Tournier, R., Europhys. Lett. 2, 1301 (1987);Google Scholar
Beno, M.A., Soderholm, L., Capone, D.W., Hinks, D.G., Jorgensen, J.D., Schuller, I.K., Segre, C.U., Zhang, K., and Grace, J.D., Appl. Phys. Lett. 51, 57 (1987);Google Scholar
Beech, F., Miraglia, S., Santoro, A., and Roth, R.S., Phys. Rev. B35, 8778 (1987).Google Scholar
3. Beyers, R., Lim, G., Engler, E.M., Lee, V.Y., Ramirez, M.L., Savoy, R.J., Jacowitz, R.D., Shaw, T.M., La Placa, S., Boehrae, R., Tsuei, C.C., Park, Sung I., Shafer, M.W., Gallagher, W.J., and Chandrashekhar, G.V., Appl. Phys. Lett. 51, 614 (1987).Google Scholar
4. Zandbergen, H.W., Van Tendeloo, G., Okabe, T., and Amelinckx, S., Solid State Comm., in press;Google Scholar
Van Tendeloo, G., Zandbergen, H.W., Okabe, T., and Amelinckx, S., Solid State Comm., 63, 389; 603; 969 (1987).Google Scholar
5. Ourmazd, A., Rentschler, J.A., Spence, J.C.H., O'Keeffe, M., Graham, R.J., Johnson, D.W., and Rhodes, W.W., Nature 327, 308 (1987);Google Scholar
Chen, C.H., Werder, D.J., Liou, S.H., Kwo, J.R., and Hong, M., Phys. Rev. B35, 8767 (1987);Google Scholar
Beyers, R., Lim, G., Engler, E.M., Savoy, R.J., Shaw, T.M., Dinger, T.R., Gallagher, W.J., Sandstrom, R.L., Appl. Phys. Lett., 50, 1918 (1987).Google Scholar
6. Chaillout, C., Capponi, J.J., Hodeau, J.L., Bordet, P., Chenavas, J., Strobel, P., and Marezio, M., Abstracts for 14th International Congress of Crystallography, Perth, Australia, 12–20 Aug. 1987, 14.4–20.Google Scholar
7. Hervieu, M., Domenges, B., Michel, C, Heger, G., Provost, J., and Raveau, B., Phys. Rev. B36, 3920 (1987).Google Scholar
8. Domenges, B., Hervieu, M., Michel, C., and Raveau, B., Europhys. Lett., 4, 211 (1987).Google Scholar
9. You, H., Axe, J.D., Kan, X.B., Moss, S.C., Liu, J.Z., and Lam, D.J., submitted to Phys. Rev. B.Google Scholar
10. Liu, J.Z., Crabtree, G.W., Umegawa, A., and Zongquau, Li, Phys. Lett. A121, 305 (1987).Google Scholar