Skip to main content Accessibility help

High-resolution Raman imaging by optically tweezing a dielectric microsphere

  • Johnson Kasim (a1), T. Yu (a2), Y. M. You (a3), J. P. Liu (a4), A. K. H. See (a5) and Z. X. Shen (a6)...


We show a different method in doing near-field Raman imaging with sub-diffraction limit spatial resolution. A dielectric microsphere (for example polystyrene microsphere) is trapped by optical tweezers. The microsphere is used to focus the laser to the sample, and also to collect the scattered Raman signals. We show the capability of this method in imaging various types of samples, such as SiGe/Si structures, gold nanopattern and carbon nanotubes. This method is comparatively easier to perform, better repeatability, and stronger signal than the normal near-field Raman techniques.



Hide All
1. Tsai, D. P., Othonos, A., Moskovits, M., and Uttamchandani, D., Appl. Phys. Lett. 64, 17681770 (1994).
2. Grausem, J., Humbert, B., Spajer, M., Courjon, D., Burneau, A., and Oswalt, J., J. Raman Specstrosc. 30, 833840 (1999).
3. Hecht, B., Sick, B., Wild, U. P., Deckert, V., Zenobi, R., Martin, O. J. F., and Pohl, D. W., J. Chem. Phys. 112, 77617774 (2000).
4. Sun, W. X. and Shen, Z. X., J. Raman Spectrosc. 34, 668676 (2003).
5. Anderson, N., Hartschuh, A., and Novotny, L., Materials Today, May, 5054 (2005).
6. Saito, Y., Motohashi, M., Hayazawa, N., Iyoki, M., and Kawata, S., Appl. Phys. Lett. 88, 143109 (2006).
7. Ashkin, A., Science 210, 10811088 (1980).
8. Li, X., Chen, Z. G., Taflove, A., and Backman, V., Opt. Express 13, 526533 (2005).
9. Yi, K. J., wang, H., Lu, Y. F., and Yang, Z. Y., J. Appl. Phys. 101, 063528 (2007).



Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed