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High-resolution Raman imaging by optically tweezing a dielectric microsphere

Published online by Cambridge University Press:  01 February 2011

Johnson Kasim
Affiliation:
g040001@ntu.edu.sg, Nanyang Technological University, Physics and Applied Physics, 1 Nanyang Walk, Blk 5 Level 3, Singapore, Singapore, 637616, Singapore
T. Yu
Affiliation:
yuting@ntu.edu.sg, Nanyang Technological University, Physics and Applied Physics, 1 Nanyang Walk, Blk 5 Level 3, Singapore, 637616, Singapore
Y. M. You
Affiliation:
g040002@ntu.edu.sg, Nanyang Technological University, Physics and Applied Physics, 1 Nanyang Walk, Blk 5 Level 3, Singapore, 637616, Singapore
J. P. Liu
Affiliation:
liuj@charteredsemi.com, Chartered Semiconductor Manufacturing Ltd., 60 Woodlands Industrial Park D, Street 2, Singapore, 738406, Singapore
A. K. H. See
Affiliation:
dralexsee@yahoo.com, Chartered Semiconductor Manufacturing Ltd., 60 Woodlands Industrial Park D, Street 2, Singapore, 738406, Singapore
Z. X. Shen
Affiliation:
zexiang@ntu.edu.sg, Nanyang Technological University, Physics and Applied Physics, 1 Nanyang Walk, Blk 5 Level 3, Singapore, 637616, Singapore
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Abstract

We show a different method in doing near-field Raman imaging with sub-diffraction limit spatial resolution. A dielectric microsphere (for example polystyrene microsphere) is trapped by optical tweezers. The microsphere is used to focus the laser to the sample, and also to collect the scattered Raman signals. We show the capability of this method in imaging various types of samples, such as SiGe/Si structures, gold nanopattern and carbon nanotubes. This method is comparatively easier to perform, better repeatability, and stronger signal than the normal near-field Raman techniques.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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